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解决抄纸机的污染对策——湿部清洁生产最佳化 被引量:1
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作者 但木孝一 朝田知子 +3 位作者 川上秀明 春日一孝 黑濑茂 林治宪(编译) 《中华纸业》 CAS 北大核心 2009年第3期69-74,共6页
近年来,由于原料质量恶化等多方面原因,大量杂物进入抄纸机系统,产生污染障碍。对此,持续开发出的高效凝结剂"REALIZER-A系列"、高效助留剂"REALIZER-R系列"组合成湿部改性系统"AXISZ系统",高效的处理了... 近年来,由于原料质量恶化等多方面原因,大量杂物进入抄纸机系统,产生污染障碍。对此,持续开发出的高效凝结剂"REALIZER-A系列"、高效助留剂"REALIZER-R系列"组合成湿部改性系统"AXISZ系统",高效的处理了来自废纸浆的憎水性树脂,大大提高了细小纤维和填料等微细成分的留着率,清洗了湿部,减少了污染障碍。新型的ASA施胶系统"REGSIS"能以最小添加量获得最佳施胶效果。新型的微生物控制系统"CURECIDE"又能有效的抑制微生物危害。采用湿部化学技术将药剂组合,从化学和生物方面系统调控,成为减少抄纸机系统等障碍的良好对策。 展开更多
关键词 抄纸机 污染障碍 对策 AXISZ系统 ASA施胶剂 微生物控制系统
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Stress control of silicon nitride films deposited by plasma enhanced chemical vapor deposition
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作者 李东玲 冯小飞 +2 位作者 温志渝 尚正国 佘引 《Optoelectronics Letters》 EI 2016年第4期285-289,共5页
Stress controllable silicon nitride(Si Nx) films deposited by plasma enhanced chemical vapor deposition(PECVD) are reported. Low stress Si Nx films were deposited in both high frequency(HF) mode and dual frequency(HF/... Stress controllable silicon nitride(Si Nx) films deposited by plasma enhanced chemical vapor deposition(PECVD) are reported. Low stress Si Nx films were deposited in both high frequency(HF) mode and dual frequency(HF/LF) mode. By optimizing process parameters, stress free(-0.27 MPa) Si Nx films were obtained with the deposition rate of 45.5 nm/min and the refractive index of 2.06. Furthermore, at HF/LF mode, the stress is significantly influenced by LF ratio and LF power, and can be controlled to be 10 MPa with the LF ratio of 17% and LF power of 150 W. However, LF power has a little effect on the deposition rate due to the interaction between HF power and LF power. The deposited Si Nx films have good mechanical and optical properties, low deposition temperature and controllable stress, and can be widely used in integrated circuit(IC), micro-electro-mechanical systems(MEMS) and bio-MEMS. 展开更多
关键词 DEPOSITION Deposition rates Integrated circuits MEMS Nitrides Optical properties Plasma CVD Refractive index Silicon nitride Stresses Vapor deposition
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