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高压型智能绝缘参数测试仪的研制
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作者 曹建明 徐一凡 霍旭颖 《上海船舶运输科学研究所学报》 2012年第1期26-31,共6页
对高压型智能绝缘参数测试仪的测试方法及关键电路进行综合分析比较,对容量大、纹波小的可调式高压电源及灵敏准确的微电压测量电路作了较深入的分析。同时论述了设计中必须注意的问题,指出了抗干扰及保护措施的意义并介绍了一种实用的... 对高压型智能绝缘参数测试仪的测试方法及关键电路进行综合分析比较,对容量大、纹波小的可调式高压电源及灵敏准确的微电压测量电路作了较深入的分析。同时论述了设计中必须注意的问题,指出了抗干扰及保护措施的意义并介绍了一种实用的处理方法。该方法在应用中取得了良好的效果。 展开更多
关键词 绝缘 采样电阻 微电压检测 量程变换
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An automated AFM for nanoindentation and force related measurements
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作者 BAI Jiang-hua Andres La Rosa 《Journal of Measurement Science and Instrumentation》 CAS CSCD 2018年第4期347-353,共7页
A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz cr... A fully automated atomic force microscope(AFM)is presented.The mechanical motion of the AFM stage was controlled by three steppers.The fine motion of the AFM was controlled by an MCL one-axis piezo plate.A32.768kHz crystal tuning fork(TF)was used as the transducer with a probe attached.An acoustic sensor was used to measure the interactions between the probe and the sample.An SR850lock-in amplifier was used to monitor the TF signals.An additional lock-in amplifier was used to monitor the acoustic signal.A field programmable gate array(FPGA)board was used to collect the data in automatic mode.The main controller was coded with LabVIEW,which was in charge of Z-axis scan,signal processing and data visualization.A manual mode and an automatic mode were implemented in the controller.Users can switch the two modes at any time during the operation.This AFM system showed several advantages during the test operations.It is simple,flexible and easy to use. 展开更多
关键词 atomic force microscope(AFM) nano indentation acoustic sensing piezo drive crystal tuning fork LabVIEW lock-in amplifier 8051microcontroller
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