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浅谈微电子故障校验
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作者 洪伟鸿 邓天军 《创新科技》 2014年第14期82-82,共1页
本文详细介绍了软件安全认证中微电子故障校验原理,并举例说明微电子故障校验的方法,提升家用电器安全性能。
关键词 软件安全认证 IEC60730 微电子故障
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Effects of Vapor Pressure and Super-Hydrophobic Nanocomposite Coating on Microelectronics Reliability
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作者 Xuejun Fan Liangbiao Chen +2 位作者 C.P.Wong Hsing-Wei Chu G.Q.Zhang 《Engineering》 SCIE EI 2015年第3期384-390,共7页
Modeling vapor pressure is crucial for studying the moisture reliability of microelectronics, as high vapor pressure can cause device failures in environments with high temperature and humidity. To minimize the impact... Modeling vapor pressure is crucial for studying the moisture reliability of microelectronics, as high vapor pressure can cause device failures in environments with high temperature and humidity. To minimize the impact of vapor pressure, a super-hydrophobic(SH) coating can be applied on the exterior surface of devices in order to prevent moisture penetration. The underlying mechanism of SH coating for enhancing device reliability, however, is still not fully understood. In this paper, we present several existing theories for predicting vapor pressure within microelectronic materials. In addition, we discuss the mechanism and effectiveness of SH coating in preventing water vapor from entering a device, based on experimental results. Two theoretical models, a micro-mechanics-based whole-field vapor pressure model and a convection-diffusion model, are described for predicting vapor pressure. Both methods have been successfully used to explain experimental results on uncoated samples. However, when a device was coated with an SH nanocomposite, weight gain was still observed, likely due to vapor penetration through the SH surface. This phenomenon may cast doubt on the effectiveness of SH coatings in microelectronic devices. Based on current theories and the available experimental results, we conclude that it is necessary to develop a new theory to understand how water vapor penetrates through SH coatings and impacts the materials underneath. Such a theory could greatly improve microelectronics reliability. 展开更多
关键词 vapor pressure MOISTURE semiconductor reliability microelectromechanical systems (MEMS) SUPERHYDROPHOBIC nanocomposite coating
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