通过参考有关文献关于卢瑟福背向散射能谱(rutherford back scattering spectrometry,RBS)、透射电镜(trans-mission electron microscope,TEM)、俄歇电子能谱(auger electron spectroscopy,AES)、红外反射谱法(infrared reflec-tion,IR...通过参考有关文献关于卢瑟福背向散射能谱(rutherford back scattering spectrometry,RBS)、透射电镜(trans-mission electron microscope,TEM)、俄歇电子能谱(auger electron spectroscopy,AES)、红外反射谱法(infrared reflec-tion,IR)等手段对绝缘衬底上硅(silicon-on-insulator,SOI)微结构的分析研究,提出并建立了一种基于SOI有效介质近似理论的多层薄膜结构模型。基于该模型,利用总反射系数对红外光谱进行模拟能很好地揭示此材料的光学表征,验证了红外反射光谱法作为一种高灵敏度的分析技术,无论是受SOI材料中所注硅岛的体积分数比,或是其几何分布等的影响,都能准确地反馈材料的光学表征信息。展开更多
Simulation approach includes such processes as photon emissions from X-ray tube with a spectral distribution, total reflection on the sample support, photoelectric effect in thin layer sample, as well as characteristi...Simulation approach includes such processes as photon emissions from X-ray tube with a spectral distribution, total reflection on the sample support, photoelectric effect in thin layer sample, as well as characteristic line absorption and detection. The calculation results are in agreement with experimental ones.展开更多
A new set of global phenomenological optical model potential parameters has been obtained for helium-3 projectile, by simultaneously fitting the experimental data of helium-3 total reaction cross sections and elastic ...A new set of global phenomenological optical model potential parameters has been obtained for helium-3 projectile, by simultaneously fitting the experimental data of helium-3 total reaction cross sections and elastic scattering angular distributions in the mass range of target nuclei 20〈〈A〈209 at incident energies below 250 MeV. A comparison has been made between the extracted helium-3 global optical model potential parameters and the existing ones. The calculated results of total reaction cross sections and elastic scattering angular distributions are also agreement. compared with experimental data with their satisfactory展开更多
文摘通过参考有关文献关于卢瑟福背向散射能谱(rutherford back scattering spectrometry,RBS)、透射电镜(trans-mission electron microscope,TEM)、俄歇电子能谱(auger electron spectroscopy,AES)、红外反射谱法(infrared reflec-tion,IR)等手段对绝缘衬底上硅(silicon-on-insulator,SOI)微结构的分析研究,提出并建立了一种基于SOI有效介质近似理论的多层薄膜结构模型。基于该模型,利用总反射系数对红外光谱进行模拟能很好地揭示此材料的光学表征,验证了红外反射光谱法作为一种高灵敏度的分析技术,无论是受SOI材料中所注硅岛的体积分数比,或是其几何分布等的影响,都能准确地反馈材料的光学表征信息。
文摘Simulation approach includes such processes as photon emissions from X-ray tube with a spectral distribution, total reflection on the sample support, photoelectric effect in thin layer sample, as well as characteristic line absorption and detection. The calculation results are in agreement with experimental ones.
基金supported by the National Natural Science Foundation of China (Grant No. 11175260)China Ministry of Science and Technology (Grant No. 2007CB209903)
文摘A new set of global phenomenological optical model potential parameters has been obtained for helium-3 projectile, by simultaneously fitting the experimental data of helium-3 total reaction cross sections and elastic scattering angular distributions in the mass range of target nuclei 20〈〈A〈209 at incident energies below 250 MeV. A comparison has been made between the extracted helium-3 global optical model potential parameters and the existing ones. The calculated results of total reaction cross sections and elastic scattering angular distributions are also agreement. compared with experimental data with their satisfactory
