For the conventional single-ended eFuse cell, sensing failures can occur due to a variation of a post-program eFuse resistance during the data retention time and a relatively high program resistance of several kilo oh...For the conventional single-ended eFuse cell, sensing failures can occur due to a variation of a post-program eFuse resistance during the data retention time and a relatively high program resistance of several kilo ohms. A differential paired eFuse cell is designed which is about half the size smaller in sensing resistance of a programmed eFuse link than the conventional single-ended eFuse cell. Also, a sensing circuit of sense amplifier is proposed, based on D flip-flop structure to implement a simple sensing circuit. Furthermore, a sensing margin test circuit is proposed with variable pull-up loads out of consideration for resistance variation of a programmed eFuse. When an 8 bit eFuse OTP IP is designed with 0.18 ~tm standard CMOS logic of TSMC, the layout dimensions are 229.04 μm ×100.15μm. All the chips function successfully when 20 test chips are tested with a program voltage of 4.2 V.展开更多
In nanoscale technology, transistor aging is one of the most critical problems that impact on the reliability of circuits. Aging sensor is a good online way to detect the circuit aging, which performs during the opera...In nanoscale technology, transistor aging is one of the most critical problems that impact on the reliability of circuits. Aging sensor is a good online way to detect the circuit aging, which performs during the operating time with no influence of the normal operation of circuits. In this paper, a Dou- ble-edge-triggered Detection Sensor for circuit Aging （DSDA） is proposed, which employs data signal of logic circuits as its clock to control the sampling process. The simulation is done by Hspice using 45 nm technology. The results show that this technique is not case of the detection precision is more than 80% under aging fault effectively with the 8% power cost and 30% sensitive to the process variations. The worst the different process variations. It can detect performance cost.展开更多
In the infrared spectrum absorbed type gas concentration sensor,voltage signal obtained from the two-channel thermopile infrared detector TPS2534 is very weak.In order to solve this problem,the authors have establishe...In the infrared spectrum absorbed type gas concentration sensor,voltage signal obtained from the two-channel thermopile infrared detector TPS2534 is very weak.In order to solve this problem,the authors have established the structure of the sensor and designed weak signal detecting circuit of the sensor based on infrared spectrum absorption principle,differential de-noising principle and weak signal detecting principle.The authors have made experiments using CH4 gas.The results show that the circuit can remove noise effectively and detect weak electrical signal obtained from the detector.展开更多
文摘For the conventional single-ended eFuse cell, sensing failures can occur due to a variation of a post-program eFuse resistance during the data retention time and a relatively high program resistance of several kilo ohms. A differential paired eFuse cell is designed which is about half the size smaller in sensing resistance of a programmed eFuse link than the conventional single-ended eFuse cell. Also, a sensing circuit of sense amplifier is proposed, based on D flip-flop structure to implement a simple sensing circuit. Furthermore, a sensing margin test circuit is proposed with variable pull-up loads out of consideration for resistance variation of a programmed eFuse. When an 8 bit eFuse OTP IP is designed with 0.18 ~tm standard CMOS logic of TSMC, the layout dimensions are 229.04 μm ×100.15μm. All the chips function successfully when 20 test chips are tested with a program voltage of 4.2 V.
基金Supported by the National Natural Science Foundation of China (No.61274036 and 61106038)Anhui Provincial Natural Science Foundation of China (No.090412034)
文摘In nanoscale technology, transistor aging is one of the most critical problems that impact on the reliability of circuits. Aging sensor is a good online way to detect the circuit aging, which performs during the operating time with no influence of the normal operation of circuits. In this paper, a Dou- ble-edge-triggered Detection Sensor for circuit Aging （DSDA） is proposed, which employs data signal of logic circuits as its clock to control the sampling process. The simulation is done by Hspice using 45 nm technology. The results show that this technique is not case of the detection precision is more than 80% under aging fault effectively with the 8% power cost and 30% sensitive to the process variations. The worst the different process variations. It can detect performance cost.
文摘In the infrared spectrum absorbed type gas concentration sensor,voltage signal obtained from the two-channel thermopile infrared detector TPS2534 is very weak.In order to solve this problem,the authors have established the structure of the sensor and designed weak signal detecting circuit of the sensor based on infrared spectrum absorption principle,differential de-noising principle and weak signal detecting principle.The authors have made experiments using CH4 gas.The results show that the circuit can remove noise effectively and detect weak electrical signal obtained from the detector.
