TN25 98021099单模光纤弯曲双折射的研究=Analysis for bending-indueed birefringence in single-mode fibers[刊,中]/王廷云(哈尔滨工业大学自动化系.黑龙江,哈尔滨(150001)),卢启柱(燕山大学计算机与信息工程系.河北,秦皇岛(066004)...TN25 98021099单模光纤弯曲双折射的研究=Analysis for bending-indueed birefringence in single-mode fibers[刊,中]/王廷云(哈尔滨工业大学自动化系.黑龙江,哈尔滨(150001)),卢启柱(燕山大学计算机与信息工程系.河北,秦皇岛(066004))∥光电子技术.-1997,17(1).-50-53分析了单模光纤弯曲引起的双折射,推导了弯曲双折射的计算公式,并建立了测量弯曲双折射的实验方法和装置。实验结果显示它与理论计算结果有好的吻合。该工作对消除光纤法拉第电流传感器的双折射影响具有很重要的意义。图3参6(严寒)展开更多
The effective optical constants that describe the interaction between electromagnetic wave and particulate composite are calculated based on effective medium theory and Mie theory.The negative refractive phenomenon is...The effective optical constants that describe the interaction between electromagnetic wave and particulate composite are calculated based on effective medium theory and Mie theory.The negative refractive phenomenon is compared between the Ge-particle-dispersed LiTaO 3 composites and Ag-particle-dispersed LiTaO 3 composites.It is indicated that the negative refraction phenomenon for semiconductor Ge particulate composite occurs in higher frequency range than that of noble Ag particulate composite.By take the Ge particulate composite as an example,the influence of size and number density of spherical particles on the negative refraction phenomenon is analyzed.It is indicated that the frequency range where negative refraction phenomenon occurs can be shifted to higher frequency by adjusting these two influencing factors.展开更多
文摘TN25 98021099单模光纤弯曲双折射的研究=Analysis for bending-indueed birefringence in single-mode fibers[刊,中]/王廷云(哈尔滨工业大学自动化系.黑龙江,哈尔滨(150001)),卢启柱(燕山大学计算机与信息工程系.河北,秦皇岛(066004))∥光电子技术.-1997,17(1).-50-53分析了单模光纤弯曲引起的双折射,推导了弯曲双折射的计算公式,并建立了测量弯曲双折射的实验方法和装置。实验结果显示它与理论计算结果有好的吻合。该工作对消除光纤法拉第电流传感器的双折射影响具有很重要的意义。图3参6(严寒)
基金supported by the National Natural Science Foundation of China (Grant Nos. 50936002 and 51006053)
文摘The effective optical constants that describe the interaction between electromagnetic wave and particulate composite are calculated based on effective medium theory and Mie theory.The negative refractive phenomenon is compared between the Ge-particle-dispersed LiTaO 3 composites and Ag-particle-dispersed LiTaO 3 composites.It is indicated that the negative refraction phenomenon for semiconductor Ge particulate composite occurs in higher frequency range than that of noble Ag particulate composite.By take the Ge particulate composite as an example,the influence of size and number density of spherical particles on the negative refraction phenomenon is analyzed.It is indicated that the frequency range where negative refraction phenomenon occurs can be shifted to higher frequency by adjusting these two influencing factors.