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双金属在掺硼金刚石表面电化学共沉积-共溶出模型 被引量:1
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作者 童希立 赵国华 +1 位作者 肖小娥 胡惠康 《物理化学学报》 SCIE CAS CSCD 北大核心 2008年第3期416-422,共7页
采用微分脉冲阳极溶出伏安法,研究了Ag+、Cu2+、Pb2+、Sn2+、Cd2+等多种共存金属离子在掺硼金刚石(BDD)表面双金属共沉积-共溶出电化学行为.结果表明,双金属在掺硼金刚石膜表面的共沉积-共溶出模型是由金属本身的析出电位,金属之间的相... 采用微分脉冲阳极溶出伏安法,研究了Ag+、Cu2+、Pb2+、Sn2+、Cd2+等多种共存金属离子在掺硼金刚石(BDD)表面双金属共沉积-共溶出电化学行为.结果表明,双金属在掺硼金刚石膜表面的共沉积-共溶出模型是由金属本身的析出电位,金属之间的相互作用,金属离子和溶液间的相互作用等多种因素决定的.微分阳极溶出法的研究结果表明,双金属在掺硼金刚石电极上的共沉积-共溶出过程表现出金属1溶出-金属2溶出、金属1溶出-析氢-金属2溶出、金属1溶出-金属合金溶出-金属2溶出、金属1溶出-析氢-金属2络合物形成-金属2溶出等四种模型. 展开更多
关键词 双金属 掺硼金刚石表面 共沉积-共溶出模型 微分脉冲阳极溶出伏安法
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A Diamond Electrochemical Cleaning Technique for Organic Contaminants on Silicon Wafer Surfaces 被引量:2
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作者 张建新 刘玉岭 +4 位作者 檀柏梅 牛新环 边永超 高宝红 黄妍妍 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第3期473-477,共5页
Peroxodiphosphate anion (a powerful oxidant) can be formed in a special water-based cleaning agent through an electrochemical reaction on boron-doped diamond electrodes. This electrochemical reaction was applied dur... Peroxodiphosphate anion (a powerful oxidant) can be formed in a special water-based cleaning agent through an electrochemical reaction on boron-doped diamond electrodes. This electrochemical reaction was applied during the oxidation,decomposition, and removal of organic contaminations on a silicon wafer surface, and it was used as the first step in the diamond electrochemical cleaning technique (DECT). The cleaning effects of DECT were compared with the RCA cleaning technique, including the silicon surface chemical composition that was observed with X-ray photoelectron spectroscopy and the morphology observed with atomic force microscopy. The measurement results show that the silicon surface cleaned by DECT has slightly less organic residue and lower micro-roughness,so the new technique is more effective than the RCA cleaning technique. 展开更多
关键词 organic contaminations silicon wafer surface cleaning boron-doped diamond electrodes powerful oxidant micro-roughness electrochemical cleaning
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