期刊文献+
共找到3篇文章
< 1 >
每页显示 20 50 100
浅析面砖釉泡和无光缺陷产生的原因及克服办法
1
作者 臧平安 《陶瓷》 CAS 1993年第2期43-44,56,共3页
一、前言传统釉面砖生产均采用二次烧成工艺,釉料为熔块釉。在生产过程中,因为生产工序长、管理难度大,产品质量易发生波动,又因产品生产周期长、制造过程中出现的一些质量缺陷又很难准确及时判断出其产生的原因,往往要经过几天,甚至几... 一、前言传统釉面砖生产均采用二次烧成工艺,釉料为熔块釉。在生产过程中,因为生产工序长、管理难度大,产品质量易发生波动,又因产品生产周期长、制造过程中出现的一些质量缺陷又很难准确及时判断出其产生的原因,往往要经过几天,甚至几十天时间才能解决克服,给正常生产带来极大威胁,并造成大量降级品和不合格品。本人根据多年生产实践经验,认为釉泡和无光两种缺陷在釉面砖生产过程中容易产生、且形成原因复杂、解决难度大。 展开更多
关键词 陶瓷 釉面砖 面砖釉泡 无光缺陷
下载PDF
Experimental investigation of subsurface damage depth of lapped optics by fluorescent method 被引量:5
2
作者 WANG Hong-xiang HOU Jing +2 位作者 WANG Jing-he ZHU Ben-wen ZHANG Yan-hu 《Journal of Central South University》 SCIE EI CAS CSCD 2018年第7期1678-1689,共12页
Subsurface defects were fluorescently tagged with nanoscale quantum dots and scanned layer by layer using confocal fluorescence microscopy to obtain images at various depths. Subsurface damage depths of fused silica o... Subsurface defects were fluorescently tagged with nanoscale quantum dots and scanned layer by layer using confocal fluorescence microscopy to obtain images at various depths. Subsurface damage depths of fused silica optics were characterized quantitatively by changes in the fluorescence intensity of feature points. The fluorescence intensity vs scan depth revealed that the maximum fluorescence intensity decreases sharply when the scan depth exceeds a critical value. The subsurface damage depth could be determined by the actual embedded depth of the quantum dots. Taper polishing and magnetorheological finishing were performed under the same conditions to verify the effectiveness of the nondestructive fluorescence method. The results indicated that the quantum dots effectively tagged subsurface defects of fused-silica optics, and that the nondestructive detection method could effectively evaluate subsurface damage depths. 展开更多
关键词 OPTICS subsurface defect nondestructive detection LAPPING subsurface damage
下载PDF
Defect-free surface of quartz glass polished in elastic mode by chemical impact reaction 被引量:1
3
作者 彭文强 关朝亮 李圣怡 《Journal of Central South University》 SCIE EI CAS 2014年第12期4438-4444,共7页
Removal of brittle materials in the brittle or ductile mode inevitably causes damaged or strained surface layers containing cracks, scratches or dislocations. Within elastic deformation, the arrangement of each atom c... Removal of brittle materials in the brittle or ductile mode inevitably causes damaged or strained surface layers containing cracks, scratches or dislocations. Within elastic deformation, the arrangement of each atom can be recovered back to its original position without any defects introduced. Based on surface hydroxylation and chemisorption theory, material removal mechanism of quartz glass in the elastic mode is analyzed to obtain defect-free surface. Elastic contact condition between nanoparticle and quartz glass surface is confirmed from the Hertz contact theory model. Atoms on the quartz glass surface are removed by chemical bond generated by impact reaction in the elastic mode, so no defects are generated without mechanical process. Experiment was conducted on a numerically controlled system for nanoparticle jet polishing, and one flat quartz glass was polished in the elastic mode. Results show that scratches on the sample surface are completely removed away with no mechanical defects introduced, and microroughness(Ra) is decreased from 1.23 nm to 0.47 nm. Functional group Ce — O — Si on ceria nanoparticles after polishing was detected directly and indirectly by FTIR, XRD and XPS spectra analysis from which the chemical impact reaction is validated. 展开更多
关键词 defect-free surface chemical impact reaction nanoparticle jet polishing elastic mode
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部