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基于可靠性分析的主动再制造时域决策 被引量:2
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作者 王贤琳 陈乐 +2 位作者 苏梅月 李卫飞 王恺 《组合机床与自动化加工技术》 北大核心 2019年第6期153-156,共4页
针对再制造毛坯件存在的不确定性问题,提出了用可靠度来表征机电产品在服役周期内性能衰退特征,阐述了机电产品在服役周期内可靠性对再制造价值的影响,确定其再制造最佳时机。通过收集的历史故障数据,运用最小二乘法以及平均秩次法对机... 针对再制造毛坯件存在的不确定性问题,提出了用可靠度来表征机电产品在服役周期内性能衰退特征,阐述了机电产品在服役周期内可靠性对再制造价值的影响,确定其再制造最佳时机。通过收集的历史故障数据,运用最小二乘法以及平均秩次法对机电产品服役周期内的可靠度变化进行拟合,以构造机电产品在服役周期内可靠度趋势曲线。通过对机电产品服役周期内的可靠性分析,得到基于可靠性分析的机电产品最佳主动再制造时间。最后以某型号的发动机叶片为例,验证了所提出的基于可靠性分析的主动再制造时域选择方法的有效性和可行性。 展开更多
关键词 主动再制造 可靠性 最小二乘法 平均秩次法 时域选择
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Modeling transmittance through submicron silver slit arrays 被引量:1
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作者 王爱华 蔡九菊 陈玉彬 《Journal of Central South University》 SCIE EI CAS 2012年第8期2107-2114,共8页
Mid-infrared transmittance of submicron silver slit arrays was numerically studied with the finite difference time domain method. The slit width varies from 50 nm to 300 nm and a square feature may attach at either or... Mid-infrared transmittance of submicron silver slit arrays was numerically studied with the finite difference time domain method. The slit width varies from 50 nm to 300 nm and a square feature may attach at either or both slit sides. Although the side length of features is one or two orders of magnitude shorter than the wavelength, the attached nanoscale features can modify the transmittance significantly. The transmittance was also further investigated in detail by looking into the electromagnetic fields and Poynting vectors of selected slit geometries. The investigation results show that such change can be attributed to the cavity resonance effect inside the slit arrays. The work is of great importance to the wavelength-selective devices design in optical devices and thermal application fields. 展开更多
关键词 finite difference time domain method TRANSMITTANCE silver slit array cavity resonance effect
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