Y2000-62575-216 0104387芯片上模/数和数/模转换器测试用的机内自测法=ABIST Scheme for on-chip ADC and DAC testing[会,英]/Huang,J.-L.& Ong,C.-K.//Proceedings of Design,Automation and Test in Europe Conference 2000.—...Y2000-62575-216 0104387芯片上模/数和数/模转换器测试用的机内自测法=ABIST Scheme for on-chip ADC and DAC testing[会,英]/Huang,J.-L.& Ong,C.-K.//Proceedings of Design,Automation and Test in Europe Conference 2000.—216~220(ZC)展开更多
文摘Y2000-62575-216 0104387芯片上模/数和数/模转换器测试用的机内自测法=ABIST Scheme for on-chip ADC and DAC testing[会,英]/Huang,J.-L.& Ong,C.-K.//Proceedings of Design,Automation and Test in Europe Conference 2000.—216~220(ZC)