本文介绍实验室自制的样品靶可以自动定位的大气压基体辅助激光解析离子源(Atmospheric Pressure Matrix Assisted Laser Desorption/Ionization,AP-MALDI)的原理、结构,以及与飞行时间质谱仪(Time of flight Mass Spectrometer,TOFMS)...本文介绍实验室自制的样品靶可以自动定位的大气压基体辅助激光解析离子源(Atmospheric Pressure Matrix Assisted Laser Desorption/Ionization,AP-MALDI)的原理、结构,以及与飞行时间质谱仪(Time of flight Mass Spectrometer,TOFMS)联用对多肽样品的分析实验。所得到的生物大分子谱图表明:AP-MALDI离子源与高分辨TOFMS联用可以实现大气压下大分子高通量的精确质量检测,最低检测限可达2.5fmol。展开更多
Al-doped zinc oxide（AZO） films were deposited on glass substrates by mid-frequency magnetron sputtering. The effects of substrate rotation speed and target-substrate distance on the electrical, optical properties an...Al-doped zinc oxide（AZO） films were deposited on glass substrates by mid-frequency magnetron sputtering. The effects of substrate rotation speed and target-substrate distance on the electrical, optical properties and microstructure and crystal structures of the resulting films were investigated by scanning electron microscopy（SEM）, atomic force microscopy（AFM）, X-ray diffraction（XRD）, spectrophotometer and Hall-effect measurement system, respectively. XRD results show that all AZO films exhibit a strong preferred c-axis orientation. However, the crystallinity of films decreases with the increase of substrate rotation speed, accompanying with the unbalanced grains grows. For the films prepared at different target-substrate distances, the uniform microstructure and morphology are observed. The highest carrier concentration of 5.9×1020 cm-3 and Hall mobility of 13.1 cm^2/（V·s） are obtained at substrate rotation speed of 0 and target-substrate distance of 7 cm. The results indicate that the structure and performances of the AZO films are strongly affected by substrate rotation speed.展开更多
文摘本文介绍实验室自制的样品靶可以自动定位的大气压基体辅助激光解析离子源(Atmospheric Pressure Matrix Assisted Laser Desorption/Ionization,AP-MALDI)的原理、结构,以及与飞行时间质谱仪(Time of flight Mass Spectrometer,TOFMS)联用对多肽样品的分析实验。所得到的生物大分子谱图表明:AP-MALDI离子源与高分辨TOFMS联用可以实现大气压下大分子高通量的精确质量检测,最低检测限可达2.5fmol。
基金Project(51302044)supported by the National Natural Science Foundation of ChinaProject(2012M521596)supported by the Chinese Postdoctoral Science FoundationProject(KLB11003)supported by the Key Laboratory of Clean Energy Materials of Guangdong Higher Education Institute,China
文摘Al-doped zinc oxide（AZO） films were deposited on glass substrates by mid-frequency magnetron sputtering. The effects of substrate rotation speed and target-substrate distance on the electrical, optical properties and microstructure and crystal structures of the resulting films were investigated by scanning electron microscopy（SEM）, atomic force microscopy（AFM）, X-ray diffraction（XRD）, spectrophotometer and Hall-effect measurement system, respectively. XRD results show that all AZO films exhibit a strong preferred c-axis orientation. However, the crystallinity of films decreases with the increase of substrate rotation speed, accompanying with the unbalanced grains grows. For the films prepared at different target-substrate distances, the uniform microstructure and morphology are observed. The highest carrier concentration of 5.9×1020 cm-3 and Hall mobility of 13.1 cm^2/（V·s） are obtained at substrate rotation speed of 0 and target-substrate distance of 7 cm. The results indicate that the structure and performances of the AZO films are strongly affected by substrate rotation speed.
