Micro/nano-thin films are widely used in the fields of micro/nano-electromechanical system(MEMS/NEMS)and flexible electronics,and their mechanical properties have an important impact on the stability and reliability o...Micro/nano-thin films are widely used in the fields of micro/nano-electromechanical system(MEMS/NEMS)and flexible electronics,and their mechanical properties have an important impact on the stability and reliability of components.However,accurate characterization of the mechanical properties of thin films still faces challenges due to the complexity of film-substrate structure,and the characterization efficiency of traditional techniques is insufficient.In this paper,a high-throughput determination method of the elastic modulus of thin films is proposed based on the strain variance method,the feasibility of which is analyzed by the finite element method(FEM),and the specific tensile configuration with array-distributed thin films is designed and optimized.Based on the strain difference between the film-substrate region and the uncoated region,the elastic modulus of multiple films is obtained simultaneously,and the influences of film width,spacing,thickness,and distribution on the measurement of elastic modulus are elucidated.The results show that the change in film width has a more obvious effect on the elastic modulus determination than film spacing and thickness,i.e.,the larger the film width is,the closer the calculation results are to the theoretical value,and the change in calculation results tends to be stabilized when the film width increases to a certain length.Specifically,the simultaneous measurement of the elastic modulus of eight metal films on a polyimide(PI)substrate with a length of 110 mm and a width of 30 mm can be realized,and the testing throughput can be further increased with the extension of the substrate length.This study provides an efficient and low-cost method for measuring the elastic modulus of thin films,which is expected to accelerate the development of new thin film materials.展开更多
This paper investigates the influence of exchange rate volatility on the volume of Japanese manufacturing export. The volatility in yen is shown by conditional variance from EGARCH (Exponential Generalized Autoregres...This paper investigates the influence of exchange rate volatility on the volume of Japanese manufacturing export. The volatility in yen is shown by conditional variance from EGARCH (Exponential Generalized Autoregressive Conditional Heteroscedasticity) model, allowing for asymmetric effects that a shock of an appreciation of the yen is different from that of a depreciation of the yen. The export action model including exchange rate volatility is constructed based on VAR (Vector Auto Regressive) model to examine the relationship between exchange rate uncertainty and the volume of export. Tests are performed for typical eight kinds of industry in Japan. Few empirical studies focus on each Japanese industry export. Results indicate significant negative effects of exchange rate volatility on most manufacturing exports. In addition, this paper analyzes the each industry, featurc of the influence of exchange rate on the volume of Japanese export. The authors find that equipment industries occupying 60% or more of total Japanese exports especially tend to receive negative influence of exchange.展开更多
In this paper, we propose a new criterion, named PICa, to simultaneously select explanatory variables in the mean model and variance model in heteroscedastic linear models based on the model structure. We show that th...In this paper, we propose a new criterion, named PICa, to simultaneously select explanatory variables in the mean model and variance model in heteroscedastic linear models based on the model structure. We show that the new criterion can select the true mean model and a correct variance model with probability tending to 1 under mild conditions. Simulation studies and a real example are presented to evaluate the new criterion, and it turns out that the proposed approach performs well.展开更多
Discriminant space defining area classes is an important conceptual construct for uncertainty characterization in area-class maps.Discriminant models were promoted as they can enhance consistency in area-class mapping...Discriminant space defining area classes is an important conceptual construct for uncertainty characterization in area-class maps.Discriminant models were promoted as they can enhance consistency in area-class mapping and replicability in error modeling.As area classes are rarely completely separable in empirically realized discriminant space,where class inseparabil-ity becomes more complicated for change categorization,we seek to quantify uncertainty in area classes(and change classes)due to measurement errors and semantic discrepancy separately and hence assess their relative margins objectively.Experiments using real datasets were carried out,and a Bayesian method was used to obtain change maps.We found that there are large differences be-tween uncertainty statistics referring to data classes and information classes.Therefore,uncertainty characterization in change categorization should be based on discriminant modeling of measurement errors and semantic mismatch analysis,enabling quanti-fication of uncertainty due to partially random measurement errors,and systematic categorical discrepancies,respectively.展开更多
文摘Micro/nano-thin films are widely used in the fields of micro/nano-electromechanical system(MEMS/NEMS)and flexible electronics,and their mechanical properties have an important impact on the stability and reliability of components.However,accurate characterization of the mechanical properties of thin films still faces challenges due to the complexity of film-substrate structure,and the characterization efficiency of traditional techniques is insufficient.In this paper,a high-throughput determination method of the elastic modulus of thin films is proposed based on the strain variance method,the feasibility of which is analyzed by the finite element method(FEM),and the specific tensile configuration with array-distributed thin films is designed and optimized.Based on the strain difference between the film-substrate region and the uncoated region,the elastic modulus of multiple films is obtained simultaneously,and the influences of film width,spacing,thickness,and distribution on the measurement of elastic modulus are elucidated.The results show that the change in film width has a more obvious effect on the elastic modulus determination than film spacing and thickness,i.e.,the larger the film width is,the closer the calculation results are to the theoretical value,and the change in calculation results tends to be stabilized when the film width increases to a certain length.Specifically,the simultaneous measurement of the elastic modulus of eight metal films on a polyimide(PI)substrate with a length of 110 mm and a width of 30 mm can be realized,and the testing throughput can be further increased with the extension of the substrate length.This study provides an efficient and low-cost method for measuring the elastic modulus of thin films,which is expected to accelerate the development of new thin film materials.
文摘This paper investigates the influence of exchange rate volatility on the volume of Japanese manufacturing export. The volatility in yen is shown by conditional variance from EGARCH (Exponential Generalized Autoregressive Conditional Heteroscedasticity) model, allowing for asymmetric effects that a shock of an appreciation of the yen is different from that of a depreciation of the yen. The export action model including exchange rate volatility is constructed based on VAR (Vector Auto Regressive) model to examine the relationship between exchange rate uncertainty and the volume of export. Tests are performed for typical eight kinds of industry in Japan. Few empirical studies focus on each Japanese industry export. Results indicate significant negative effects of exchange rate volatility on most manufacturing exports. In addition, this paper analyzes the each industry, featurc of the influence of exchange rate on the volume of Japanese export. The authors find that equipment industries occupying 60% or more of total Japanese exports especially tend to receive negative influence of exchange.
基金supported by National Natural Science Foundation of China (Grant No.10971007)Beijing Natural Science Fund (Grant No. 1072003)Science Fund of Beijing Education Committee
文摘In this paper, we propose a new criterion, named PICa, to simultaneously select explanatory variables in the mean model and variance model in heteroscedastic linear models based on the model structure. We show that the new criterion can select the true mean model and a correct variance model with probability tending to 1 under mild conditions. Simulation studies and a real example are presented to evaluate the new criterion, and it turns out that the proposed approach performs well.
基金Supported by the National Natural Science Foundation of China (No.41171346,No. 41071286)the Fundamental Research Funds for the Central Universities (No. 20102130103000005)the National 973 Program of China (No. 2007CB714402‐5)
文摘Discriminant space defining area classes is an important conceptual construct for uncertainty characterization in area-class maps.Discriminant models were promoted as they can enhance consistency in area-class mapping and replicability in error modeling.As area classes are rarely completely separable in empirically realized discriminant space,where class inseparabil-ity becomes more complicated for change categorization,we seek to quantify uncertainty in area classes(and change classes)due to measurement errors and semantic discrepancy separately and hence assess their relative margins objectively.Experiments using real datasets were carried out,and a Bayesian method was used to obtain change maps.We found that there are large differences be-tween uncertainty statistics referring to data classes and information classes.Therefore,uncertainty characterization in change categorization should be based on discriminant modeling of measurement errors and semantic mismatch analysis,enabling quanti-fication of uncertainty due to partially random measurement errors,and systematic categorical discrepancies,respectively.