Mode matching method is used to analyze the scattering characteristics of thecircular-to-circular groove waveguide junction. Matching the electric fields and magnetic fields atthe boundary of the junction, and multipl...Mode matching method is used to analyze the scattering characteristics of thecircular-to-circular groove waveguide junction. Matching the electric fields and magnetic fields atthe boundary of the junction, and multiplying the mode functions of the circular waveguide andcircular groove waveguide on both sides of the boundary equation, the scattering matrix equation isobtained, the scattering coefficients can be obtained from the equation. Then the scatteringcharacteristics of the iris with circular window in circular groove waveguide are analyzed. At lastthe convergent problem is discussed; when choosing a suitable mode group, convergent numericalresults are obtained, and the frequency response of the iris' scattering coefficients is also given.展开更多
In this work propagation of anti-plane (SH) waves in two piezoelectric ceramic half-spaces with a thin layer of a semiconducting material between the half-spaces is studied, and wave attenuation and dispersion caused ...In this work propagation of anti-plane (SH) waves in two piezoelectric ceramic half-spaces with a thin layer of a semiconducting material between the half-spaces is studied, and wave attenuation and dispersion caused by semiconduction as well as wave amplification by a biasing electric field are examined. Key words Piezoelectricity - Semiconductor - Wave - Attenuation - Dispersion Document code A CLC number TH11展开更多
A simple setup for the measurement of transmission loss in polymer thin film optical waveguides is described. A new electro-optic polymer film has been prepared. The transmission loss of the film is measured before an...A simple setup for the measurement of transmission loss in polymer thin film optical waveguides is described. A new electro-optic polymer film has been prepared. The transmission loss of the film is measured before and after corona poling. And the loss is determined to be 1.84 dB/cm and 2.14 dB/cm, respectively.展开更多
Optimal parameters for depositing Titanium nitride （TIN） thin films by DC reactive magnetron sputtering were determined. TiN thin films were deposited on Si （100） substrates by DC reactive magnetron sputtering, at...Optimal parameters for depositing Titanium nitride （TIN） thin films by DC reactive magnetron sputtering were determined. TiN thin films were deposited on Si （100） substrates by DC reactive magnetron sputtering, at different temperatures, different electrical current values, and different N2/Ar ratios. Structural characteristics of TiN thin films were measured by X-ray diffraction （XRD）; surface morphology of the thin films was characterized using an atomic force microscope （AFM）. The electric resistivity of the TiN films was measured by a four-point probe. In the result, temperature is 500℃, electrical current value is 1.6 A, pure N2 is the reacting gas, TiN thin film has the preferred （200） orientation, resistance is small enough for its use as bottom electrodes.展开更多
The characteristic modifications are reported on the surface of polymeric waveguide film in the process of vol- ume-grating fabrication. The light from a mode-locked 76 MHz femtosecond laser with pulse duration of 200...The characteristic modifications are reported on the surface of polymeric waveguide film in the process of vol- ume-grating fabrication. The light from a mode-locked 76 MHz femtosecond laser with pulse duration of 200 fs and wavelength of 800 nm is focused normal to the surface of the sample. The surface morphology modifications are as- cribed to a fact that surface swelling occurs during the process. Periodic micro-structure is inscribed with increasing incident power. The laser-induced swelling threshold on the grating, which is higher than that of two-photon initiated photo-polymerization （TPIP） （8 mW）, is verified to be about 20 mW. It is feasible to enhance the surface smoothness of integrated optics devices for further encapsulation. The variation of modulation depth is studied for different values of incident power and scan spacing. Ablation accompanied with surface swelling appears when the power is higher. By ootimizing the laser carvinR oararneters, hizhly efficient grating devices can be fabricated.展开更多
文摘Mode matching method is used to analyze the scattering characteristics of thecircular-to-circular groove waveguide junction. Matching the electric fields and magnetic fields atthe boundary of the junction, and multiplying the mode functions of the circular waveguide andcircular groove waveguide on both sides of the boundary equation, the scattering matrix equation isobtained, the scattering coefficients can be obtained from the equation. Then the scatteringcharacteristics of the iris with circular window in circular groove waveguide are analyzed. At lastthe convergent problem is discussed; when choosing a suitable mode group, convergent numericalresults are obtained, and the frequency response of the iris' scattering coefficients is also given.
文摘In this work propagation of anti-plane (SH) waves in two piezoelectric ceramic half-spaces with a thin layer of a semiconducting material between the half-spaces is studied, and wave attenuation and dispersion caused by semiconduction as well as wave amplification by a biasing electric field are examined. Key words Piezoelectricity - Semiconductor - Wave - Attenuation - Dispersion Document code A CLC number TH11
文摘A simple setup for the measurement of transmission loss in polymer thin film optical waveguides is described. A new electro-optic polymer film has been prepared. The transmission loss of the film is measured before and after corona poling. And the loss is determined to be 1.84 dB/cm and 2.14 dB/cm, respectively.
基金Project supported by the National Natural Science Foundation of China (No. 60478039) and the Natural Science Foundation of Zheji-ang Province (No. X405002), China
文摘Optimal parameters for depositing Titanium nitride （TIN） thin films by DC reactive magnetron sputtering were determined. TiN thin films were deposited on Si （100） substrates by DC reactive magnetron sputtering, at different temperatures, different electrical current values, and different N2/Ar ratios. Structural characteristics of TiN thin films were measured by X-ray diffraction （XRD）; surface morphology of the thin films was characterized using an atomic force microscope （AFM）. The electric resistivity of the TiN films was measured by a four-point probe. In the result, temperature is 500℃, electrical current value is 1.6 A, pure N2 is the reacting gas, TiN thin film has the preferred （200） orientation, resistance is small enough for its use as bottom electrodes.
基金supported by the National Natural Science Foundation of China/the Research Grants Council of Hong Kong Joint Research Scheme a grant for NSFC/RGC(No.50218001)the National Science Foundation of China(No.50173015)
文摘The characteristic modifications are reported on the surface of polymeric waveguide film in the process of vol- ume-grating fabrication. The light from a mode-locked 76 MHz femtosecond laser with pulse duration of 200 fs and wavelength of 800 nm is focused normal to the surface of the sample. The surface morphology modifications are as- cribed to a fact that surface swelling occurs during the process. Periodic micro-structure is inscribed with increasing incident power. The laser-induced swelling threshold on the grating, which is higher than that of two-photon initiated photo-polymerization （TPIP） （8 mW）, is verified to be about 20 mW. It is feasible to enhance the surface smoothness of integrated optics devices for further encapsulation. The variation of modulation depth is studied for different values of incident power and scan spacing. Ablation accompanied with surface swelling appears when the power is higher. By ootimizing the laser carvinR oararneters, hizhly efficient grating devices can be fabricated.
