Developing photon scanning tunneling microscope (PSTM) has been attrating much attention after the invention of STM. The vertical characteristic of the evanescent field has been measured and the result cosists with th...Developing photon scanning tunneling microscope (PSTM) has been attrating much attention after the invention of STM. The vertical characteristic of the evanescent field has been measured and the result cosists with the oretical calculation. It is a key progress for building a PSTM.展开更多
The characteristic of near-field spots is analyzed.The size of the near field and the heat response time of the hybrid record medium to overcome super paramagnetic effect are calculated based on the heat transfer theo...The characteristic of near-field spots is analyzed.The size of the near field and the heat response time of the hybrid record medium to overcome super paramagnetic effect are calculated based on the heat transfer theory. A novel measuring method for the diameter of near-field recording spot is also presented. Since the grain of the recording media is tiny enough,near-field optical lithography can be accomplished with the aid of atomic force microscope (AFM).The diameter of near-field recording spot can be obtained by specifically designed computer.So the relationship between the near-field recording spot diameter and the probe size of near-field recording system, the near field recording distance coupling between head and disc can be got.展开更多
文摘Developing photon scanning tunneling microscope (PSTM) has been attrating much attention after the invention of STM. The vertical characteristic of the evanescent field has been measured and the result cosists with the oretical calculation. It is a key progress for building a PSTM.
文摘The characteristic of near-field spots is analyzed.The size of the near field and the heat response time of the hybrid record medium to overcome super paramagnetic effect are calculated based on the heat transfer theory. A novel measuring method for the diameter of near-field recording spot is also presented. Since the grain of the recording media is tiny enough,near-field optical lithography can be accomplished with the aid of atomic force microscope (AFM).The diameter of near-field recording spot can be obtained by specifically designed computer.So the relationship between the near-field recording spot diameter and the probe size of near-field recording system, the near field recording distance coupling between head and disc can be got.
