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电化学深蚀刻打印零件号的研究 被引量:1
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作者 李翔龙 林朝镛 刘锄东 《现代机械》 北大核心 1998年第3期19-20,共2页
本文研究了电化学深蚀刻打印零件号的一种新方法,介绍了加工原理、研制的设备、工艺及应用效果.
关键词 电化学 深蚀刻 模板 打印 零件号
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玻璃表面化学深蚀刻的工艺原理与操作方案
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作者 周利泰 《玻璃艺术》 2006年第2期52-55,共4页
本文对平板玻璃表面化学蚀刻做一些较为通俗的理性论述:一、化学蚀刻的原理:我们知道玻璃属于无机硅物质中的一种,非晶态固体。易碎;透明。它与我们的生活密不可分,现代人已不再满足于物理式机械手段加工的艺术玻璃制品,更致力于... 本文对平板玻璃表面化学蚀刻做一些较为通俗的理性论述:一、化学蚀刻的原理:我们知道玻璃属于无机硅物质中的一种,非晶态固体。易碎;透明。它与我们的生活密不可分,现代人已不再满足于物理式机械手段加工的艺术玻璃制品,更致力于用多种化学方式对玻璃表面进行求新求异深加工, 展开更多
关键词 玻璃表面 工艺原理 表面化学 操作方案 深蚀刻 化学蚀刻 非晶态固体 玻璃制品 加工 无机硅
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深蚀刻二元光学技术制作准分子曝光系统均匀器 被引量:2
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作者 徐平 李景镇 《中国科学(E辑)》 CSCD 2000年第6期510-518,共9页
利用深蚀刻二元光学理论和技术设计并制作了用于准分子激光器曝光系统的深蚀刻二元光学均匀器 .与原来使用的积分均匀器 (石英棒列阵 )相比 ,该均匀器具有重量轻 ,安装调控方便 ,光能利用率高 ,光束均匀性好等特点 .对该器件的设计性能... 利用深蚀刻二元光学理论和技术设计并制作了用于准分子激光器曝光系统的深蚀刻二元光学均匀器 .与原来使用的积分均匀器 (石英棒列阵 )相比 ,该均匀器具有重量轻 ,安装调控方便 ,光能利用率高 ,光束均匀性好等特点 .对该器件的设计性能和参数进行了研究、分析和计算机模拟 ;在高精度台阶仪上对所制作的深蚀刻二元光学均匀器进行了精密检测 ;用深蚀刻元件制作误差理论并引入“边界误差”概念 ,对元件的表面浮雕检测结果进行了深入的分析 .理论与实验结果符合得很好 . 展开更多
关键词 深蚀刻 误差分析 准分子激光器 曝光系统 大规模集成电路 光束均匀性 二元光学均匀器 光能利用率
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超厚铜半埋型PCB制造技术研究
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作者 卢赛辉 吴永德 +1 位作者 侯代云 张建林 《印制电路信息》 2023年第8期30-32,共3页
超厚铜多层印制电路板(PCB)产品应用于强电流连接传输及强弱电混合连接的部件。探究一种埋入式的0.49 mm超厚铜PCB制作技术,其产品应用于新能源系统及新式大型智能装备总线等具有大电流特点的设备。控深蚀刻技术可解决超厚铜板图形制作... 超厚铜多层印制电路板(PCB)产品应用于强电流连接传输及强弱电混合连接的部件。探究一种埋入式的0.49 mm超厚铜PCB制作技术,其产品应用于新能源系统及新式大型智能装备总线等具有大电流特点的设备。控深蚀刻技术可解决超厚铜板图形制作的蚀刻难点,多层板压合白斑、分层及流胶异常问题,超厚铜的多次电镀、多次干膜制作及阻焊图形制作有高低差等困难。超厚铜产品制作技术起源于北美地区,国内涉及较少。利用该技术方法成功完成超厚铜多层板制作,为国内未来特殊的多层超厚铜板制作提供基础。 展开更多
关键词 超厚铜 压合 深蚀刻 阻焊
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飞机零件号打印方法的研究及应用
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作者 李翔龙 林朝镛 刘锄东 《四川联合大学学报(工程科学版)》 EI CAS CSCD 1998年第3期91-94,共4页
本文对各种零件号打印方法进行了分析比较,认为采用电化学方法来打印飞机零件号最为合理,并介绍了电化学深蚀刻加工工艺。
关键词 打印方法 电化学 深蚀刻 飞机 零件号 标记号
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谈局部厚铜板的制作流程 被引量:2
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作者 蒋华 张宏 +2 位作者 何艳球 张亚锋 郭宇 《印制电路信息》 2019年第10期51-56,共6页
局部厚铜板在生产过程中,需要重点管控局部厚铜板的蚀刻深度、半固化片(PP)开窗尺寸设计及残胶、底片曝光的吸真空度及压合失压、缺胶、铜箔起皱等问题。文章主要通过对局部厚铜板的生产流程进行研究,并总结出一种能适合此类型板批量生... 局部厚铜板在生产过程中,需要重点管控局部厚铜板的蚀刻深度、半固化片(PP)开窗尺寸设计及残胶、底片曝光的吸真空度及压合失压、缺胶、铜箔起皱等问题。文章主要通过对局部厚铜板的生产流程进行研究,并总结出一种能适合此类型板批量生产的制作流程。 展开更多
关键词 局部厚铜 深蚀刻 压合 曝光 汽车板
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Fabrication of Ultra Deep Electrical Isolation Trenches with High Aspect Ratio Using DRIE and Dielectric Refill
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作者 朱泳 闫桂珍 +4 位作者 王成伟 杨振川 范杰 周健 王阳元 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2005年第1期16-21,共6页
A novel technique to fabricate ultra deep high aspect ratio electrical isolation trenches with DRIE and dielectric refill is presented.The relationship between trench profile and DRIE parameters is discussed.By optimi... A novel technique to fabricate ultra deep high aspect ratio electrical isolation trenches with DRIE and dielectric refill is presented.The relationship between trench profile and DRIE parameters is discussed.By optimizing DRIE parameters and RIE etching the trenches’ opening,the ideal trench profile is obtained to ensure that the trenches are fully refilled without voids.The electrical isolation trenches are 5μm wide and 92μm deep with 0.5μm thick oxide layers on the sidewall as isolation material.The measured I-V result shows that the trench structure has good electrical isolation performance:the average resistance in the range of 0~100V is more than 10 11Ω and no breakdown appears under 100V.This isolation trench structure has been used in fabrication of the bulk integrated micromachined gyroscope,which shows high performance. 展开更多
关键词 deep reactive ion etching electrical isolation trenches bulk microstructures monolithic integration
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光衍射、仪器与器件
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《中国光学》 EI CAS 1997年第5期12-13,共2页
O436.1 97052875二元光学元件衍射效率的逐层分析法研究=Studyof diffraction efficiency of binary optical elementswith layer by layer analysis method[刊,中]/叶钧,许乔,侯西云,杨国光(浙江大学高技术现代光学中心,浙江,杭州(3100... O436.1 97052875二元光学元件衍射效率的逐层分析法研究=Studyof diffraction efficiency of binary optical elementswith layer by layer analysis method[刊,中]/叶钧,许乔,侯西云,杨国光(浙江大学高技术现代光学中心,浙江,杭州(310027))∥光学学报.—1996,16(10).—1350—1355提出了一种有效的分析二元光学元件衍射效率的新方法—逐层分析法,并对四台阶二元器件,就蚀刻深度误差和横向对准误差对器件衍射效率的影响进行了分析和讨论,证明用该方法分析含有横向对准误差的二元光学元件的横向衍射效率非常简便有效。 展开更多
关键词 衍射效率 二元光学元件 逐层分析 位相光栅 对准误差 微细加工光学技术 深蚀刻 信息光学 二元器件 国家重点实验室
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Experimental Study on the Footing Effect for SOG Structures Using DRIE 被引量:1
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作者 丁海涛 杨振川 +1 位作者 张美丽 闫桂珍 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第6期1088-1093,共6页
This paper experimentally studies the effects of the conductivity of a silicon wafer and the gap height between silicon structures and glass substrate on the footing effect for silicon on glass (SOG) structures in t... This paper experimentally studies the effects of the conductivity of a silicon wafer and the gap height between silicon structures and glass substrate on the footing effect for silicon on glass (SOG) structures in the deep reactive ion etching (DRIE) process. Experiments with gap heights of 5,20, and 50μm were carried out for performance comparison of the footing effect. Also,two kinds of silicon wafers with resistivity of 2-4 and 0.01-0. 0312Ω· cm were used for the exploration. The results show that structures with resistivity of 0.01 - 0. 0312Ω· cm have better topography than those with resistivity of 2-4Ω· cm; and structures with 50μm-high gaps between silicon structures and glass substrate suffer some- what less of a footing effect than those with 20μm-high gaps,and much less than those with Stem-high gaps. Our theoretical analysis indicates that either the higher conductivity of the silicon wafer or a larger gap height between silicon structures and glass substrate can suppress footing effects. The results can contribute to the choice of silicon type and optimum design for many microsensors. 展开更多
关键词 footing effect silicon on glass deep reactive ion etching
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一种高精度浅绝缘层板的制作技术
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作者 邹明亮 刘晓丽 +1 位作者 蒋华 黄慧 《印制电路信息》 2020年第8期30-33,共4页
高精度浅层绝缘板板在生产过程,需要重点管控控深蚀刻图形的设计、镀锡及碱性蚀刻的管控。本文主要通过对高精度浅层绝缘板的生产流程进行研究,并总结出一种能适合此类型板批量生产的制作流程。
关键词 背钻 深蚀刻 浅层绝缘
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The even device fabricated by the deep etched binary optics technology for the exposure system of the quasi-molecule laser 被引量:5
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作者 徐平 孙一翎 李景镇 《Science China(Technological Sciences)》 SCIE EI CAS 2002年第1期1-9,共9页
By applying the specific properties and the fabricating technology of the deep etched elements presented by us, the even device of deep etched binary optics has been designed and fabricated which can be used in quasi-... By applying the specific properties and the fabricating technology of the deep etched elements presented by us, the even device of deep etched binary optics has been designed and fabricated which can be used in quasi-molecule laser exposure system. This even device is light in weight, easy to adjust and has a high utilization rate of energy and is able to project well-distributed light beams. So it is better than the conventional one which was an array made up of quartz sticks. The properties and designed parameters were studied and simulated. The fabricated even was precisely tested by high precision Alpha-Steper. The testing result of the surface relief structures of the even has been profoundly analyzed by introducing “boundary errors”. The theory agrees well with the results of the experiment. This is the first successful application of the deep etched theory and technology of binary optics to the exposure system of microfabrication. 展开更多
关键词 deep etched binary optics element even device error analysis
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Polarization Analysis of an Asymmetrically Etched Rib Waveguide Coupler for Sensing Applications 被引量:1
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作者 Malathi SATHISH Srinivas TALABATTULA 《Photonic Sensors》 SCIE EI CAS 2013年第2期178-183,共6页
Deeply etched rib waveguides on silicon on insulator platform were not addressed well in research publications. We have analyzed single mode condition and polarization independence of a deeply etched rib waveguide (D... Deeply etched rib waveguides on silicon on insulator platform were not addressed well in research publications. We have analyzed single mode condition and polarization independence of a deeply etched rib waveguide (DE-RW) structure from biosensing perspective. With this rib structure, an asymmetrically etched integrated optic directional coupler has been numerically modeled to have the same coupling length for quasi- TE and TM modes. The coupling coefficients with the glucose solution as an upper cladding were calculated using a full vector mode solver, and the bulk refractive index sensitivity of the sensor was found as 28.305 × 10^-2/RIU for a fundamental quasi-TE mode. 展开更多
关键词 Silicon on insulator (SOI) deeply etched rib waveguide asymmetrically etched directional coupler BIOSENSOR
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Symmetrical fully-etched and chirped beam splitter based on a subwavelength binary blazed grating
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作者 周唯 张华良 +1 位作者 杨俊波 杨俊才 《Optoelectronics Letters》 EI 2012年第3期182-185,共4页
A novel symmetrical chirped beam splitter based on a binary blazed grating is proposed, which adopts the fully-etched grating structure compatible with the current fabrication facilities for CMOS technology and conven... A novel symmetrical chirped beam splitter based on a binary blazed grating is proposed, which adopts the fully-etched grating structure compatible with the current fabrication facilities for CMOS technology and convenient for integration and manufacture process. This structure can realize nearly equal-power splitting operation under the condition of TE polarization incidence. When the absolutely normal incidence occurs at the wavelength of 1580 nm, the coupling efficiencies of the left and the right branches are 43.627% and 43.753%, respectively. Moreover, this structure has the tolerances of 20 nm in etched depth and 3?in incident angle, which is rather convenient to manufacture facility. 展开更多
关键词 CMOS integrated circuits Optical instruments PRISMS
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A single-mask dry-release process for fabrication of high aspect ratio SOI MEMS devices
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作者 YANG ZhenChuan WEI YuMin +1 位作者 MAO Xu YAN GuiZhen 《Science China(Technological Sciences)》 SCIE EI CAS 2013年第2期387-391,共5页
A single-mask dry-release process for fabrication of high aspect ratio SOI MEMS devices is presented,which takes advantage of the lag effect in silicon DRIE(deep reactive ion etching).The wide trenches and the releasi... A single-mask dry-release process for fabrication of high aspect ratio SOI MEMS devices is presented,which takes advantage of the lag effect in silicon DRIE(deep reactive ion etching).The wide trenches and the releasing holes are etched to the buried oxide in the first-step DRIE whereas the narrow trenches are still connected due to the lag effect.After the buried oxide is removed by wet etching through the opened releasing holes and wide trenches,the narrow trenches are etched through by the second-step DRIE.Not only can the sticking problems be avoided,but also the footing effect during the DRIE can be partially suppressed.The feasibility of the proposed technique was verified by implementing a capacitive accelerometer.The scale factor and the non-linearity of the fabricated accelerometer were measured to be 63.4 mV/g and 0.1% with the measurement range of ±1 g,respectively. 展开更多
关键词 SOI dry release lag effect ACCELEROMETER footing effect
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