If the measuring signals wore input to the chaotic dynamic system as initial parameters, the system outputs might be in steady state, periodic state or chaos state. If the chaotic dynamic system outputs controlled in ...If the measuring signals wore input to the chaotic dynamic system as initial parameters, the system outputs might be in steady state, periodic state or chaos state. If the chaotic dynamic system outputs controlled in the periodic states, the periodic numbers would be changed most with the signals. Our novel method is to add chaotic dynamic vibration to the measurement or sensor system. The sensor sensitivity and precision of a measurement system would be improved with this method. Chaotic dynamics measurement algorithms are given and their sensitivity to parameters are analyzed in this paper. The effects of noises on the system are discussed,展开更多
Y2000-62039 00099911999年 IEEE 仪器与测量技术会议录,卷1=1999IEEE Proceedings of the 16th instrumentation and mea-surement technology conference,Vol.1[会,英]/IEEEInstrumentation and Measurement Society.—IEEE,1999.—60...Y2000-62039 00099911999年 IEEE 仪器与测量技术会议录,卷1=1999IEEE Proceedings of the 16th instrumentation and mea-surement technology conference,Vol.1[会,英]/IEEEInstrumentation and Measurement Society.—IEEE,1999.—606P.(EC)展开更多
文摘If the measuring signals wore input to the chaotic dynamic system as initial parameters, the system outputs might be in steady state, periodic state or chaos state. If the chaotic dynamic system outputs controlled in the periodic states, the periodic numbers would be changed most with the signals. Our novel method is to add chaotic dynamic vibration to the measurement or sensor system. The sensor sensitivity and precision of a measurement system would be improved with this method. Chaotic dynamics measurement algorithms are given and their sensitivity to parameters are analyzed in this paper. The effects of noises on the system are discussed,
文摘Y2000-62039 00099911999年 IEEE 仪器与测量技术会议录,卷1=1999IEEE Proceedings of the 16th instrumentation and mea-surement technology conference,Vol.1[会,英]/IEEEInstrumentation and Measurement Society.—IEEE,1999.—606P.(EC)