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Angular distribution of sputtered atoms induced by low-energy heavy ion bombardment 被引量:2
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作者 ZHANGLai ZHANGZhu-Lin 《Nuclear Science and Techniques》 SCIE CAS CSCD 2004年第6期340-343,共4页
The sputtering yield angular distributions have been calculated based on the ion energy dependence of to- tal sputtering yields for Ni and Mo targets bombarded by low-energy Hg+ ion. The calculated curves show excelle... The sputtering yield angular distributions have been calculated based on the ion energy dependence of to- tal sputtering yields for Ni and Mo targets bombarded by low-energy Hg+ ion. The calculated curves show excellent agreement with the corresponding Wehner’s experimental results of sputtering yield angular distribution. The fact clearly demonstrated the intrinsic relation between the ion energy dependence of total sputtering yields and the sput- tering yield angular distribution. This intrinsic relation had been ignored in Yamamura’s papers (1981,1982) due to some obvious mistakes. 展开更多
关键词 溅射当量 辐角分布 各向异性效应 原子物理学
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