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A Chip Level Thermal Analysis Algorithm Using Boundary Element Method
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作者 崔铭栋 赵文庆 唐璞山 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第5期558-564,共7页
With the scale of integration and operation speed of modern ICs increasing,a series of thermo-related problems arise.Hot spots,which are due to the uneven distribution of heat,invalidate some functions of the chip.An ... With the scale of integration and operation speed of modern ICs increasing,a series of thermo-related problems arise.Hot spots,which are due to the uneven distribution of heat,invalidate some functions of the chip.An algorithm is presented to calculate the profile.With the boundary element method,3D problems are converted into 2D ones,so the temperatures of both the chip surface and inner points can be calculated quickly.This algorithm can be used to evaluate the thermal quality of a definite chip. 展开更多
关键词 VLSI thermal analysis
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