The new method of measuring the ratio of thermal emission rate to the photoexcitation constant is presented. The temperature dependence of the ratio for Cr:GaAs is calculated by using the previously published data of ...The new method of measuring the ratio of thermal emission rate to the photoexcitation constant is presented. The temperature dependence of the ratio for Cr:GaAs is calculated by using the previously published data of two-wave mixing. Results show that the calculating data and previous phenomenological theoretic ones coincide with each other very well.展开更多
文摘The new method of measuring the ratio of thermal emission rate to the photoexcitation constant is presented. The temperature dependence of the ratio for Cr:GaAs is calculated by using the previously published data of two-wave mixing. Results show that the calculating data and previous phenomenological theoretic ones coincide with each other very well.
