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小样本时电器产品可靠性特征量的估计 被引量:1
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作者 王景芹 唐义良 +1 位作者 陆俭国 赵文亚 《系统工程与电子技术》 EI CSCD 2000年第10期94-96,共3页
随着航空、航天电器产品可靠性的提高 ,其可靠性试验一般采用定时截尾寿命试验 ,如产品的可靠性很高 ,则可能会出现发生故障的样品个数较少 ,即出现了小样本数据的情况 ,若采用经典方法估计其可靠性特征量会引入较大误差。针对这种情况... 随着航空、航天电器产品可靠性的提高 ,其可靠性试验一般采用定时截尾寿命试验 ,如产品的可靠性很高 ,则可能会出现发生故障的样品个数较少 ,即出现了小样本数据的情况 ,若采用经典方法估计其可靠性特征量会引入较大误差。针对这种情况引入了平均寿命的修正极大似然估计公式。研究结果表明 ,修正后的平均寿命估计量的相对误差比极大似然估计法的相对误差有了明显减小 ,且截尾程度越高 。 展开更多
关键词 可靠性 极大似然估计 电器 小样本 特征量估计
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A Half-Power Trace Formulas for the Generalized Jaulent-Miodek Equation
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作者 李雪梅 《Chinese Quarterly Journal of Mathematics》 CSCD 1993年第4期10-14,共5页
A new dispersive relation is found and a half-pow tormulas for the generalize Miodek equation under the deeaying conditions at infinity are obtained.
关键词 generalized Jaulent-Miodck equation half-power trace
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Estimates on the amplitude of the first Dirichlet eigenvector in discrete frameworks
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作者 DIACONIS Persi MICLO Laurent 《Science China Mathematics》 SCIE CSCD 2016年第2期205-226,共22页
Consider a finite absorbing Markov generator, irreducible on the non-absorbing states. PerronFrobenius theory ensures the existence of a corresponding positive eigenvector ψ. The goal of the paper is to give bounds o... Consider a finite absorbing Markov generator, irreducible on the non-absorbing states. PerronFrobenius theory ensures the existence of a corresponding positive eigenvector ψ. The goal of the paper is to give bounds on the amplitude max ψ/ min ψ. Two approaches are proposed: One using a path method and the other one, restricted to the reversible situation, based on spectral estimates. The latter approach is extended to denumerable birth and death processes absorbing at 0 for which infinity is an entrance boundary. The interest of estimating the ratio is the reduction of the quantitative study of convergence to quasi-stationarity to the convergence to equilibrium of related ergodic processes, as seen by Diaconis and Miclo(2014). 展开更多
关键词 finite absorbing Markov process first Dirichlet eigenvector path method spectral estimates denumerable absorbing birth and death process entrance boundary
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