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计算机视觉特技:任意形状多层次图像复杂合成的图像处理特技艺术效果
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作者 陈冠 《电子出版》 2001年第3期48-51,共4页
计算机图形图像艺术作品的创作数量和水平不但反映一个国家计算机图形图象学的应用水平.也是一个国家计算机艺术学学科水平最重要和最终的评价指标之一。中国人民大学计算机图形图象学与艺术学研究室陈冠先生经过多年默默无闻的潜心攻... 计算机图形图像艺术作品的创作数量和水平不但反映一个国家计算机图形图象学的应用水平.也是一个国家计算机艺术学学科水平最重要和最终的评价指标之一。中国人民大学计算机图形图象学与艺术学研究室陈冠先生经过多年默默无闻的潜心攻关创作.成果丰硕. 1999年至今不断发表计算机图形图象与艺术经典作品.仅全彩色大型 (A4)计算机二维艺术作品艺术作品已累积发表29幅,其中有11幅由国家核心刊物《中国图形图象学报》刊登.部分计算机图形图像艺术作品水平已达到美国同类作品的水平:《中国图形图象学报》和本刊特别设立“电脑艺术”专栏,连续刊发其论文和作品。这在国内计算机艺术学学科领域独一无二。 本文明确指出:位图图像编辑处理软件进行图像合成创作的复杂和艺术效果远远超过任何传统合成特技的最高水平。软件图像合成的边缘处理天衣无缝。本研究范例创造性地将位图编辑软件多层任意形状复杂图像合成的潜力发挥到极限.图像合成及边缘处理达到完美程度。目前未见国内学术界发表同类论文。 展开更多
关键词 计算机视觉特技 任意形状 图像合成 图像处理 特技艺术效果
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浅析观众欣赏心理与电视节目制作
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作者 隋宝丽 李扬 《黑河学刊》 2002年第1期67-68,共2页
关键词 观念 欣赏心理 电视节目 节目制作 民族文化 特技艺术
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The study on the beauty of Yulin Tea-picking
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作者 Mei Pang 《International English Education Research》 2014年第11期35-37,共3页
Yulin was belong to "Hundred Yue" in ancient time, the Zhuang and Yao nationality was the indigenous people here. After the Qin and Han Dynasties, the central plains people constantly migrating to the south not only... Yulin was belong to "Hundred Yue" in ancient time, the Zhuang and Yao nationality was the indigenous people here. After the Qin and Han Dynasties, the central plains people constantly migrating to the south not only brought the advanced agricultural technology, but also a lot of Hafts customs and folk music, including the "picking flower lanterns", "tea-picking drama" and other folk music cultures which combined with the local pristine "tea plucking" folk songs, and then the "tea plucking" music culture began to have its own unique artistic features. These characteristics contributed to highlight the beauty of Yulin tea plucking opera. This article mainly discusses Yulin tea-picking Drama's rich aesthetic connotation through elaborating its music, lyrics, the theme, dancing, and clothing etc. 展开更多
关键词 Yulin Tea-picking Drama music LYRICS THEME DANCING clothing
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Microbiological Quality of Traditional Romanian Cheeses from the Rucar-Bran Pass and its Surrounding Regions
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作者 Constantin Savu Ionul Neagu +1 位作者 Catalina-Nicoleta Boi,teanu Ovidiu Savu 《Journal of Life Sciences》 2015年第1期7-17,共11页
The traditional products' quality is often recognized based on organoleptic characteristics without considering the microbiological features, which bring a special note to these products' composition and aroma. It i... The traditional products' quality is often recognized based on organoleptic characteristics without considering the microbiological features, which bring a special note to these products' composition and aroma. It is especially the case of cheeses, whose taste varies from one geographical region to another depending on specific flora and technological processes used in traditional systems. The paper tries to bring new elements on the methodology used in order to elucidate some aspects related to traditional products' quality, products obtained by private producers in the Bra^ov district (Rucar-Bran pass). Covasna district and Bistrita Nasaud district were analyzed organoleptically, physico-chemically and microbiologically samples of fresh cow cheese, soft cow cheese, smoked curd cheese, gaiter cheese and cottage cheese taken within the strategic and self-control program from individuals in the rural areas of Fundata, Poiana Sibiului, Sirnea, Pfirliu, Cristian, Cincaor, Sohodol, Ranov, Brarov, Bod, Roadea, Harnan, Prejmer, Soars, Rupea, Lunca Calnicului, Balanii, Mari, Bran, Buzaiel, Bacut, H~.lchiu, Fagraa, Moeciu de Sus, Purcaareni, Bran-Simon, Venelia de Jos, Vama Buzatului, lntorsura Buzaului, Vatrghia and Sita Buzaului. 展开更多
关键词 Traditional cheese Rucair-Bran pass microbiological quality.
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Characterization of single-event multiple cell upsets in a custom SRAM in a 65 nm triple-well CMOS technology
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作者 CHEN HaiYan CHEN JianJun YAO Long 《Science China(Technological Sciences)》 SCIE EI CAS CSCD 2015年第10期1726-1730,共5页
In this paper, the characterization of single event multiple cell upsets(MCUs) in a custom SRAM is performed in a 65 nm triple-well CMOS technology, and O(linear energy transfer(LET) = 3.1 Me V cm2/mg), Ti(LET = 22.2 ... In this paper, the characterization of single event multiple cell upsets(MCUs) in a custom SRAM is performed in a 65 nm triple-well CMOS technology, and O(linear energy transfer(LET) = 3.1 Me V cm2/mg), Ti(LET = 22.2 Me V cm2/mg) and Ge(LET = 37.4 Me V cm2/mg) particles are employed. The experimental results show that the percentage of MCU events in total upset events is 71.11%, 83.47% and 85.53% at O, Ti and Ge exposures. Moreover, due to the vertical well isolation layout, 100%(O), 100%(Ti) and 98.11%(Ge) MCU cluster just present at one or two adjacent columns, but there are still 4 cell upsets in one MCU cluster appearing on the same word wire. The characterization indicates that MCUs have become the main source of soft errors in SRAM, and even though combining the storage array interleaving distance(ID) scheme with the error detection and correction(EDAC) technique, the MCUs cannot be completely eliminated, new radiation hardened by design techniques still need to be further studied. 展开更多
关键词 multiple cell upsets (MCUs) static random access memories (SRAM) vertical well isolation radiation hardened by de-sign
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