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电路“秘密”巧识别
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作者 孙金霞 《数理天地(初中版)》 2006年第5期29-29,共1页
题1 如图1,电压表测量的是( ) (A)R1两端的电压. (B)R2两端的电压. (C)R1、R2两端的总电压. (D)电源两端的电压。分析有同学根据用电器距离电压表的远近来判断电压表的测量对象,错选了(A).电压表测量的应是并联部分的电压。
关键词 电压 电路 读出电压 电源电压 电表 示数 并联 滑动变阻器 定值电阻 测量对象
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A Novel Readout System for Wireless Passive Pressure Sensors 被引量:2
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作者 Huixin Zhang Yingping Hong +2 位作者 Binger Ge Ting Liang Jijun Xiong 《Photonic Sensors》 SCIE EI CAS 2014年第1期70-76,共7页
This paper presents a novel readout system for wireless passive pressure sensors based on the inductively coupled inductor and cavity (LC) resonant circuits. The proposed system consists of a reader antenna inductiv... This paper presents a novel readout system for wireless passive pressure sensors based on the inductively coupled inductor and cavity (LC) resonant circuits. The proposed system consists of a reader antenna inductively coupled to the sensor circuit, a readout circuit, and a personal computer (PC) post processing unit. The readout circuit generates a voltage signal representing the sensor's capacitance. The frequency of the reader antenna driving signal is a constant, which is equal to the sensor's resonant frequency at zero pressure. Based on mechanical and electrical modeling, the pressure sensor design based on the high temperature co-fired ceramic (HTCC) technology is conducted and discussed. The functionality and accuracy of the readout system are tested with a voltage-capacitance measurement system and demonstrated in a realistic pressure measurement environment, so that the overall performance and the feasibility of the readout system are proved. 展开更多
关键词 Wireless passive pressure sensors LC resonant circuits HTCC inductive coupling
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New design of sense amplifier for EEPROM memory
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作者 Dong-sheng LIU Xue-cheng ZOU +1 位作者 Qiong YU Fan ZHANG 《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 SCIE EI CAS CSCD 2009年第2期179-183,共5页
We present a new sense amplifier circuit for EEPROM memory. The topology of the sense amplifier uses a voltage sensing method,having low cost and low power consumption as well as high reliability. The sense amplifier ... We present a new sense amplifier circuit for EEPROM memory. The topology of the sense amplifier uses a voltage sensing method,having low cost and low power consumption as well as high reliability. The sense amplifier was implemented in an EEPROM realized with an SMIC 0.35-μm 2P3M CMOS embedded EEPROM process. Under the condition that the power supply is 3.3 V,simulation results showed that the charge time is 35 ns in the proposed sense amplifier,and that the maximum average current consumption during the read period is 40 μA. The novel topology allows the circuit to function with power supplies as low as 1.4 V. The sense amplifier has been implemented in 2-kb EEPROM memory for RFID tag IC applications,and has a silicon area of only 240 μm2. 展开更多
关键词 EEPROM Sense amplifier (SA) Voltage sensing Bidirectional conduction
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记一节实验设计课的教学
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作者 李华君 《物理教师》 1997年第1期16-17,6,共3页
“用电流表和电压表测电池的电动势和内电阻”是高二年级的一个学生实验,笔者对这一实验的教学进行了大胆改革,打乱课本中学生实验的先后顺序,即在讲完“伏安法”测电阻一节内容和完成学生实验“练习用多用电表测电阻”之后,安排“用电... “用电流表和电压表测电池的电动势和内电阻”是高二年级的一个学生实验,笔者对这一实验的教学进行了大胆改革,打乱课本中学生实验的先后顺序,即在讲完“伏安法”测电阻一节内容和完成学生实验“练习用多用电表测电阻”之后,安排“用电流表和电压表测电池电动势和内电阻”这一实验.并且将实验设计的主动权交给学生,把教师对实验的讲解变成学生的自我实验设计.课前给学生布置任务:现有一节干电池,今要测出它的电动势和内电阻,要求每一个学生独立设计出测量方案.鼓励创新,提倡采用不同方法,以期殊途同归.对设计方案,重在说明所需器材、实验电路和实验原理,以便在课堂上师生共同讨论. 展开更多
关键词 电压 内电阻 设计课 读出电压 学生实验 多用电表 实验设计 干电池 设计方案 电池电动势
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Multi-stage dual replica bit-line delay technique for process-variation-robust timing of low voltage SRAM sense amplifier
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作者 Chao WU Lu-ping XU +1 位作者 Hua ZHANG Wen-bo ZHAO 《Frontiers of Information Technology & Electronic Engineering》 SCIE EI CSCD 2015年第8期700-706,共7页
A multi-stage dual replica bit-line delay (MDRBD) technique is proposed for reducing access time by suppressing the sense-amplifier enable (SAE) timing variation of low voltage static randomaccess memory (SRAM) ... A multi-stage dual replica bit-line delay (MDRBD) technique is proposed for reducing access time by suppressing the sense-amplifier enable (SAE) timing variation of low voltage static randomaccess memory (SRAM) applications. Compared with the traditional technique, this strategy, using statistical theory, reduces the timing variation by using multi-stage ideas, meanwhile doubling the replica bit-fine (RBL) capacitance and discharge path simultaneously in each stage. At a supply voltage of 0.6 V, the simulation results show that the standard deviations of the SAE timing and cycle time with the proposed technique are 69.2% and 47.2%, respectively, smaller than that with a conventional RBL delay technique in TSMC 65 nm CMOS technology (Taiwan Semiconductor Manufacturing Company, Taiwan). 展开更多
关键词 Process-variation-robust Sense amplifier (SA) Replica bit-line (RBL) delay Timing variation
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