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料位控制仪
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《技术与市场》 1997年第7期13-13,共1页
料位控制仪LWY—6料位控制仪专为固体料位而设置的控制、报警装置。其核心部件为PLC(可编程序控制器)。该控制仪采用先进的反射式光探头,对6路固体料位进行检测。每路料位高度是由置于料仓、料槽中的光探头获取信号,经PL... 料位控制仪LWY—6料位控制仪专为固体料位而设置的控制、报警装置。其核心部件为PLC(可编程序控制器)。该控制仪采用先进的反射式光探头,对6路固体料位进行检测。每路料位高度是由置于料仓、料槽中的光探头获取信号,经PLC滤波、去伪处理运算,获得一个料位... 展开更多
关键词 料位控制仪 可编程序控制器 光探头 固体料位 控制输出信号 电器触电 技术指标 报警装置 料位检测 光报警
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Study on the failure mechanism of Ag-Ce contacts in DC level 被引量:2
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作者 MENG Fan-bin LU Jian-guo +2 位作者 LU Ning-yi CHEN Zhi-chao CHEN Qi 《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 SCIE EI CAS CSCD 2007年第3期449-452,共4页
Nominal contact resistance, minimum erosion and material transfer are required with low cost materials working in a wide currents range for DC relays. Ag-Ni contact materials have low contact resistance, but the erosi... Nominal contact resistance, minimum erosion and material transfer are required with low cost materials working in a wide currents range for DC relays. Ag-Ni contact materials have low contact resistance, but the erosion and material transfer are large at high current level. Ag-SnO2 contact materials have good anti-welding properties and resistance to arc erosion, but they have large contact resistance during working and are easily block SnO2 from flocking together on the surface at low current level. In this paper, the failure mechanisms of Ag-Ce contact material were studied. The surface morphologies of the contacts after electrical endurance test for Ag-Ce contact material were compared with that of Ag-Ni and Ag-SnO2 contact materials. The effect of Ce on the surface morphologies of the contacts after electrical endurance test was analyzed. 展开更多
关键词 RELAYS Electric contact Failure analysis
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Study on reliability technology of contactor relay 被引量:3
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作者 LIU Guoojin ZHAO Jing-ying +2 位作者 WANG Hai-tao YANG Chen-guang SUN Shun-li 《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 SCIE EI CAS CSCD 2007年第3期481-484,共4页
In this paper, the reliability of contactor relay is studied. There are three main parts about reliability test and analysis. First, in order to analyze reliability level of contact relay, the failure ratio ranks are ... In this paper, the reliability of contactor relay is studied. There are three main parts about reliability test and analysis. First, in order to analyze reliability level of contact relay, the failure ratio ranks are established as index base on the product level. Second, the reliability test method is put forward. The sample plan of reliability compliance test is gained from reliability sample theory. The failure criterion is ensured according to the failure modes of contactor relay. Third, after reliability test experiment, the analysis of failure physics is made and the failure reason is found. 展开更多
关键词 Contactor relay RELIABILITY Failure mode
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A 0.35μm CMOS 6.1GHz 1∶4 Static Frequency Divider
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作者 陆建华 Wang Zhigong +5 位作者 Chen Haitao Xie Tingting Chen Zhiheng Tian Lei Dong Yi Xie Shizhong 《High Technology Letters》 EI CAS 2003年第2期65-67,共3页
A 1∶4 static frequency divider has been designed and realized in a 0.35-micron standard CMOS technology. The chip consists of two identical 1∶2 divider cells, which are based on SCL (Source Coupled Logic) flip-flops... A 1∶4 static frequency divider has been designed and realized in a 0.35-micron standard CMOS technology. The chip consists of two identical 1∶2 divider cells, which are based on SCL (Source Coupled Logic) flip-flops. By revising the traditional topology of SCL flip-flop, we get a divider with better performances. Measurement results show that the whole chip achieves the frequency division at more than 6GHz. Each 1∶2 divider consumes 11mW from a 3.3V supply. The divider can be used in RF and Optic-fiber Transceivers and other high-speed systems. 展开更多
关键词 frequency divider FLIP-FLOP CMOS
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