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电场辐射干扰测试中天线系数的校准
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作者 沈国连 《航空电子技术》 北大核心 2000年第1期38-43,共6页
论述了屏蔽暗室电场辐射干扰测试中天线系数几个基本校准方法的原理;指出了现有某些规范中校准方法的不足,提出了一种新的供屏蔽暗室使用的校准方法——接收天线多维校准法.
关键词 天线系数 电场辐射干扰测试 多维校正法
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一种微光像增强器的电磁兼容设计与实现 被引量:1
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作者 杜培德 褚祝军 +5 位作者 曾进能 朱文锦 周盛涛 李晓露 李亚情 左加宁 《红外技术》 CSCD 北大核心 2023年第6期658-662,共5页
一种微光像增强器的抗电磁干扰能力弱,不能通过电磁兼容(electromagnetic compatibility, EMC)试验,因此推测其在战场的复杂电磁环境下很可能出现同试验结果一样的现象,即荧光屏闪烁、高亮、熄灭等,可能干扰夜视观察。为了满足EMC要求,... 一种微光像增强器的抗电磁干扰能力弱,不能通过电磁兼容(electromagnetic compatibility, EMC)试验,因此推测其在战场的复杂电磁环境下很可能出现同试验结果一样的现象,即荧光屏闪烁、高亮、熄灭等,可能干扰夜视观察。为了满足EMC要求,本文首先进行电磁兼容试验摸底,基于试验结果分析该像增强器的EMC设计薄弱环节,确定了影响EMC的关键因素,其次开展高频滤波、金属屏蔽和低阻抗接地等设计技术,最终在200 V/m强电场抗干扰试验中,该微光像增强器在全频率范围内稳定显示,通过了测试,具备了抗电磁干扰能力。 展开更多
关键词 微光像增强器 电磁兼容 电场辐射干扰
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Electromagnetic emanation exploration in FPGA-based digital design
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作者 Van Toan NGUYEN Minh Tung DAM Jeong-Gun LEE 《Journal of Central South University》 SCIE EI CAS CSCD 2019年第1期158-167,共10页
As semiconductor technologies have been shrinking,the speed of circuits,integration density,and the number of I/O interfaces have been significantly increasing.As a consequence,electromagnetic emanation(EME)becomes a ... As semiconductor technologies have been shrinking,the speed of circuits,integration density,and the number of I/O interfaces have been significantly increasing.As a consequence,electromagnetic emanation(EME)becomes a critical issue in digital system designs.Electronic devices must meet electromagnetic compatibility(EMC)requirements to ensure that they operate properly,and safely without interference.I/O buffers consume high currents when they operate.The bonding wires,and lead frames are long enough to play as efficient antennas to radiate electromagnetic interference(EMI).Therefore,I/O switching activities significantly contribute to the EMI.In this paper,we evaluate and analyze the impact of I/O switching activities on the EME.We will change the circuit configurations such as the supply voltage for I/O banks,their switching frequency,driving current,and slew rate.Additionally,a trade-off between the switching frequencies and the number of simultaneous switching outputs(SSOs)is also considered in terms of EME.Moreover,we evaluate the electromagnetic emissions that are associated with the different I/O switching patterns.The results show that the electromagnetic emissions associated I/O switching activities depend strongly on their operating parameters and configurations.All the circuit implementations and measurements are carried out on a Xilinx Spartan-3 FPGA. 展开更多
关键词 electromagnetic interference electromagnetic emanation near field emissions field programmable gate array slew rate
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