基于IC卡电子路单存储装置的设计与实现

本文提出了在公交车辆正点运营监控系统中采用IC卡存储电子路单的一种应用方法,介绍了整个装置硬件电路的设计与实现,关键软件模块的编程。系统试运行结果表明,本装置可靠性高、存储容量大、使用方便,具有一定的实效性。

一种新型的低成本公交车辆运营管理系统

文中分析了现今公交车辆运营管理系统的现状,针对公交系统现在所使用的基于GPS/GSM电子化车辆管理系统的缺点,提出了一个新的基于无线扩频通信技术和GSM网络的公交车辆运营管理系统解决方案。新系统内在的伸展性使之可胜任不同的运营规模,并通过引入电子路单的概念,实现了与现有的公交系统管理模式的完全融合。文中对方案的硬件和软件系统都作了详细的介绍。

A Hybrid Random Number Generator Using Single Electron Tunneling Junctions and MOS Transistors

This paper proposes a novel single electron random number generator （RNG）. The generator consists of multiple tunneling junctions （MTJ） and a hybrid single electron transistor （SET）/MOS output circuit. It is an oscillator-based RNG. MTJ is used to implement a high-frequency oscillator, which uses the inherent physical randomness in tunneling events of the MTJ to achieve large frequency drift. The hybrid SET and MOS output circuit is used to amplify and buffer the output signal of the MTJ oscillator. The RNG circuit generates high-quality random digital sequences with a simple structure. The operation speed of this circuit is as high as 1GHz. The circuit also has good driven capability and low power dissipation. This novel random number generator is a promising device for future cryptographic systems and communication applications.

Quantum computational advantage via 60-qubit 24-cycle random circuit sampling

To ensure a long-term quantum computational advantage,the quantum hardware should be upgraded to withstand the competition of continuously improved classical algorithms and hardwares.Here,we demonstrate a superconducting quantum computing systems Zuchongzhi 2.1,which has 66 qubits in a two-dimensional array in a tunable coupler architecture.The readout fidelity of Zuchongzhi 2.1 is considerably improved to an average of 97.74%.The more powerful quantum processor enables us to achieve larger-scale random quantum circuit sampling,with a system scale of up to 60 qubits and 24 cycles,and fidelity of FXEB=(3·66±0·345)×10^(-4).The achieved sampling task is about 6 orders of magnitude more difficult than that of Sycamore[Nature 574,505(2019)]in the classic simulation,and 3 orders of magnitude more difficult than the sampling task on Zuchongzhi 2.0[arXiv:2106.14734(2021)].The time consumption of classically simulating random circuit sampling experiment using state-of-the-art classical algorithm and supercomputer is extended to tens of thousands of years(about 4·8×104years),while Zuchongzhi 2.1 only takes about 4.2 h,thereby significantly enhancing the quantum computational advantage.

On-chip boost regulator with projected off- and on-time control

The boost type power supplies are widely used in portable consumer electronics to step up the input voltage to adapt for the high voltage applications like light-emitting diode(LED) driving and liquid crystal display(LCD) biasing.In these applications,a regulator with small volume,fewer external components and high efficiency is highly desired.This paper proposes a projected off-and on-time boost control scheme,based on which a monolithic IC with an on-chip VDMOS with 0.2 Ω on-state resistance RDS-ON was implemented in 1.5 μm bipolar-CMOS-DMOS(BCD) process.A 12 V,0.3 A boost regulator prototype is presented as well.With projected off-time and modulated on-time in continuous conduction mode(CCM),a quasi fixed frequency,which is preferred for ripple control,is realized.With projected on-time and modulated off-time in discontinuous conduction mode(DCM),pulse frequency modulation(PFM) operation,which is beneficial to light load efficiency improvement,is achieved without extra control circuitry.Measurement results show that an efficiency of 3% higher than that of a conventional method under 0.5 W output is achieved while a step load transient response comparable to that of current mode control is maintained as well.

A single-photon fault-detection method for nanocircuits that use GaN material

As the complexity of nanocircuits continues to increase,developing tests for them becomes more difficult.Failure analysis and the localization of internal test points within nanocircuits are already more difficult than for conventional integrated circuits.In this paper,a new method of testing for faults in nanocircuits is presented that uses single-photon detection to locate failed components(or failed signal lines)by utilizing the infrared photon emission characteristics of circuits.The emitted photons,which can carry information about circuit structure,can aid the understanding of circuit properties and locating faults.In this paper,in order to enhance the strength of emitted photons from circuit components,test vectors are designed for circuits’components or signal lines.These test vectors can cause components to produce signal transitions or switching behaviors according to their positions,thereby increasing the strength of the emitted photons.A multiple-valued decision diagram(MDD),in the form of a directed acrylic graph,is used to produce the test vectors.After an MDD corresponding to a circuit is constructed,the test vectors are generated by searching for specific paths in the MDD of that circuit.Experimental results show that many types of faults such as stuck-at faults,bridging faults,crosstalk faults,and others,can be detected with this method.