To ensure a long-term quantum computational advantage,the quantum hardware should be upgraded to withstand the competition of continuously improved classical algorithms and hardwares.Here,we demonstrate a superconduct...To ensure a long-term quantum computational advantage,the quantum hardware should be upgraded to withstand the competition of continuously improved classical algorithms and hardwares.Here,we demonstrate a superconducting quantum computing systems Zuchongzhi 2.1,which has 66 qubits in a two-dimensional array in a tunable coupler architecture.The readout fidelity of Zuchongzhi 2.1 is considerably improved to an average of 97.74%.The more powerful quantum processor enables us to achieve larger-scale random quantum circuit sampling,with a system scale of up to 60 qubits and 24 cycles,and fidelity of FXEB=(3·66±0·345)×10^(-4).The achieved sampling task is about 6 orders of magnitude more difficult than that of Sycamore[Nature 574,505(2019)]in the classic simulation,and 3 orders of magnitude more difficult than the sampling task on Zuchongzhi 2.0[arXiv:2106.14734(2021)].The time consumption of classically simulating random circuit sampling experiment using state-of-the-art classical algorithm and supercomputer is extended to tens of thousands of years(about 4·8×104years),while Zuchongzhi 2.1 only takes about 4.2 h,thereby significantly enhancing the quantum computational advantage.展开更多
As the complexity of nanocircuits continues to increase,developing tests for them becomes more difficult.Failure analysis and the localization of internal test points within nanocircuits are already more difficult tha...As the complexity of nanocircuits continues to increase,developing tests for them becomes more difficult.Failure analysis and the localization of internal test points within nanocircuits are already more difficult than for conventional integrated circuits.In this paper,a new method of testing for faults in nanocircuits is presented that uses single-photon detection to locate failed components(or failed signal lines)by utilizing the infrared photon emission characteristics of circuits.The emitted photons,which can carry information about circuit structure,can aid the understanding of circuit properties and locating faults.In this paper,in order to enhance the strength of emitted photons from circuit components,test vectors are designed for circuits’components or signal lines.These test vectors can cause components to produce signal transitions or switching behaviors according to their positions,thereby increasing the strength of the emitted photons.A multiple-valued decision diagram(MDD),in the form of a directed acrylic graph,is used to produce the test vectors.After an MDD corresponding to a circuit is constructed,the test vectors are generated by searching for specific paths in the MDD of that circuit.Experimental results show that many types of faults such as stuck-at faults,bridging faults,crosstalk faults,and others,can be detected with this method.展开更多
基金the National Key R&D Program of China(2017YFA0304300),the Chinese Academy of Sciences,Anhui Initiative in Quantum Information Technologies,Technology Committee of Shanghai Municipality,National Natural Science Foundation of China(11905217,11774326,and 11905294)‘Shang-hai Municipal Science and Technology Major Project(2019SHZDZX01)’Natural Science Foundation of Shanghai(19ZR1462700)‘Key-Area Research and Development Program of Guangdong Province(2020B0303030001)’the Youth Talent Lifting Project(2020-JCJQ-QT-030)。
文摘To ensure a long-term quantum computational advantage,the quantum hardware should be upgraded to withstand the competition of continuously improved classical algorithms and hardwares.Here,we demonstrate a superconducting quantum computing systems Zuchongzhi 2.1,which has 66 qubits in a two-dimensional array in a tunable coupler architecture.The readout fidelity of Zuchongzhi 2.1 is considerably improved to an average of 97.74%.The more powerful quantum processor enables us to achieve larger-scale random quantum circuit sampling,with a system scale of up to 60 qubits and 24 cycles,and fidelity of FXEB=(3·66±0·345)×10^(-4).The achieved sampling task is about 6 orders of magnitude more difficult than that of Sycamore[Nature 574,505(2019)]in the classic simulation,and 3 orders of magnitude more difficult than the sampling task on Zuchongzhi 2.0[arXiv:2106.14734(2021)].The time consumption of classically simulating random circuit sampling experiment using state-of-the-art classical algorithm and supercomputer is extended to tens of thousands of years(about 4·8×104years),while Zuchongzhi 2.1 only takes about 4.2 h,thereby significantly enhancing the quantum computational advantage.
基金supported by the National Natural Science Foundation of China(Grant No.61072028)the Project of the Department of Education of Guangdong Province(Grant No.2012KJCX0040)the Guangdong Province and Chinese Ministry of Education Cooperation Project of Industry,Education,and Academy(Grant No.2009B090300339)
文摘As the complexity of nanocircuits continues to increase,developing tests for them becomes more difficult.Failure analysis and the localization of internal test points within nanocircuits are already more difficult than for conventional integrated circuits.In this paper,a new method of testing for faults in nanocircuits is presented that uses single-photon detection to locate failed components(or failed signal lines)by utilizing the infrared photon emission characteristics of circuits.The emitted photons,which can carry information about circuit structure,can aid the understanding of circuit properties and locating faults.In this paper,in order to enhance the strength of emitted photons from circuit components,test vectors are designed for circuits’components or signal lines.These test vectors can cause components to produce signal transitions or switching behaviors according to their positions,thereby increasing the strength of the emitted photons.A multiple-valued decision diagram(MDD),in the form of a directed acrylic graph,is used to produce the test vectors.After an MDD corresponding to a circuit is constructed,the test vectors are generated by searching for specific paths in the MDD of that circuit.Experimental results show that many types of faults such as stuck-at faults,bridging faults,crosstalk faults,and others,can be detected with this method.
