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对集成电路电学可靠性验证方法的研究
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作者 满育瑄 《电子制作》 2017年第13期79-80,共2页
在学习集成电路的过程中发现,电路设计还要完成电学可靠性验证。所以,本文在分析集成电路电学可靠性的验证内容的基础上,对Composer电学规则验证、Synopsys Hsim验证、内部PERL脚本验证和Calinbre PERC验证这四种集成电路电学可靠性验... 在学习集成电路的过程中发现,电路设计还要完成电学可靠性验证。所以,本文在分析集成电路电学可靠性的验证内容的基础上,对Composer电学规则验证、Synopsys Hsim验证、内部PERL脚本验证和Calinbre PERC验证这四种集成电路电学可靠性验证方法进行了介绍,从而为有关内容的学习提供参考。 展开更多
关键词 集成电路 电学可靠性 验证方法
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氢元素对铟镓锌氧化物薄膜晶体管性能的影响 被引量:1
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作者 邵龑 丁士进 《物理学报》 SCIE EI CAS CSCD 北大核心 2018年第9期22-29,共8页
对国际上有关铟镓锌氧化物薄膜晶体管中氢元素的来源、存在形式、表征方法以及对器件性能的影响进行了综述.氢元素是铟镓锌氧化物薄膜晶体管中最为常见的杂质元素,能以正离子和负离子两种形式存在于薄膜晶体管的沟道中,并对器件性能和... 对国际上有关铟镓锌氧化物薄膜晶体管中氢元素的来源、存在形式、表征方法以及对器件性能的影响进行了综述.氢元素是铟镓锌氧化物薄膜晶体管中最为常见的杂质元素,能以正离子和负离子两种形式存在于薄膜晶体管的沟道中,并对器件性能和电学可靠性产生影响.对铟镓锌氧化物薄膜晶体管而言,沟道中氢元素浓度越高,其场效应迁移率越高、亚阈值摆幅越小、器件的电学稳定性也越好.同时,工艺处理温度过低或过高都不利于其器件性能的改善,通常以200—300?C为宜. 展开更多
关键词 铟镓锌氧化物 薄膜晶体管 氢元素杂质 电学可靠性
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Thermo-mechanical fatigue reliability optimization of PBGA solder joints based on ANN-PSO 被引量:2
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作者 周继承 肖小清 +2 位作者 恩云飞 陈妮 王湘中 《Journal of Central South University of Technology》 EI 2008年第5期689-693,共5页
Based on a method combined artificial neural network (ANN) with particle swarm optimization (PSO) algorithm, the thermo-mechanical fatigue reliability of plastic ball grid array (PBGA) solder joints was studied. The s... Based on a method combined artificial neural network (ANN) with particle swarm optimization (PSO) algorithm, the thermo-mechanical fatigue reliability of plastic ball grid array (PBGA) solder joints was studied. The simulation experiments of accelerated thermal cycling test were performed by ANSYS software. Based on orthogonal array experiments, a back-propagation artificial neural network (BPNN) was used to establish the nonlinear multivariate relationship between thermo-mechanical fatigue reliability and control factors. Then, PSO was applied to obtaining the optimal levels of control factors by using the output of BPNN as the affinity measure. The results show that the control factors, such as print circuit board (PCB) size, PCB thickness, substrate size, substrate thickness, PCB coefficient of thermal expansion (CTE), substrate CTE, silicon die CTE, and solder joint CTE, have a great influence on thermo-mechanical fatigue reliability of PBGA solder joints. The ratio of signal to noise of ANN-PSO method is 51.77 dB and its error is 33.3% less than that of Taguchi method. Moreover, the running time of ANN-PSO method is only 2% of that of the BPNN. These conclusions are verified by the confirmative experiments. 展开更多
关键词 thermo-meehanical fatigue reliability solder joints plastic ball grid array finite element analysis Taguehi method artificial neural network particle swarm optimization
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