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Preparation of Indium Tin Oxide films deposited by reactive evaporation at different substrate-temperature and the properties 被引量:3
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作者 LI Lin-na XUE Jun-ming +2 位作者 ZHAO Ying LI Yang-xian GENG Xin-hua 《Optoelectronics Letters》 EI 2007年第6期438-440,共3页
The Indium Tin Oxide films have been prepared at different substrate-temperamre on glass substrates by reactive evaporation of In-Sn alloy with an oxygen pressure of 1.3 × 10^-1Pa and a deposition rate of 10.2 nr... The Indium Tin Oxide films have been prepared at different substrate-temperamre on glass substrates by reactive evaporation of In-Sn alloy with an oxygen pressure of 1.3 × 10^-1Pa and a deposition rate of 10.2 nrrds. The best ITO films obtained have an electrical resistivity of 4.35 × 10^4 Ω.cm, a carrier concentration of 4,02 × 10^2o cm^-3 and a Hall mobility of 67.5 cm2wlsI. The influence of the substrate-temperamre on the structural, optical and electrical properties of the obtained films has been investigated. 展开更多
关键词 薄膜生长 基片 电抗蒸发 温度
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