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基于电子产品湿热对绝缘及介电强度影响的探讨
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作者 庄少红 谭耀堂 《环境技术》 2022年第5期165-168,173,共5页
潮湿环境对产品的影响是不可忽视的,尤其是电子产品。通常情况下,符合安全要求的电子元器件表面在经过湿热试验后不得出现凝露。然而市面仍存在一些元器件在经过该试验后表面出现凝露。有一些技术和方法可以有效地防止凝露在潮湿环境中... 潮湿环境对产品的影响是不可忽视的,尤其是电子产品。通常情况下,符合安全要求的电子元器件表面在经过湿热试验后不得出现凝露。然而市面仍存在一些元器件在经过该试验后表面出现凝露。有一些技术和方法可以有效地防止凝露在潮湿环境中形成。下面就一些技术方法进行探讨和分析。 展开更多
关键词 湿热 露点 凝露 绝缘 电气()强度 影响 分析
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Measurement of Swarm Parameters of c-C_4F_8/CO_2 and Its Insulation Characteristics Analysis 被引量:1
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作者 张刘春 肖登明 +1 位作者 张栋 吴变桃 《Journal of Shanghai Jiaotong university(Science)》 EI 2008年第4期448-452,共5页
In c-C4F8 and c-C4F8/CO2 mixtures, the swarm parameters including ionization coefficient, attachment coefficient and effective ionization coefficient were obtained at the ratio of the electric field strength to the ga... In c-C4F8 and c-C4F8/CO2 mixtures, the swarm parameters including ionization coefficient, attachment coefficient and effective ionization coefficient were obtained at the ratio of the electric field strength to the gas density between 150-550 Td by the steady-state Townsend (SST) method. Static breakdown voltages at each ratio were also measured at the SST condition. The limiting field strengths were obtained by two methods: computing the density-normalized effective ionization coefficient as a function of the overall density-reduced electric field strength; and measuring static breakdown voltages as a function of the product of gas density and electrode separation. Good agreement was obtained by these two methods, which ensures the correctness of the former method. The limiting field strengths of c-C4F8 and c-C4F8/CO2 mixtures were compared with those of pure SF6, 8F6/602 mixtures and pure c-C4F8. It is found that buffer gas CO2 does not reduce the limiting field strengths of c-C4F8 greatly, the limiting field strengths of c-C4F8/CO2 mixtures are higher than those of SF6/CO2 mixtures or even pure SF6, and so c-C4F8/CO2 mixtures are suggested to be possible substitutes for SF6. 展开更多
关键词 c-C4F8/CO2 SF6 steady state Townsend (SST) swarm parameters dielectric strength
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