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浅淡电桥对电缆故障部位的检测
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作者 曾凡茂 《职业》 2010年第8X期105-105,共1页
用单臂电桥来测定电缆故障的部位,测试时电缆应有一根完好的芯线,否则要借用其他平行线路上的芯线,或临时安装一根回路线。当电桥平衡时,电桥两臂电阻值之比应等于电缆芯线回路组成的两电阻值之比,这是由于导线电阻与它的长度成正比。... 用单臂电桥来测定电缆故障的部位,测试时电缆应有一根完好的芯线,否则要借用其他平行线路上的芯线,或临时安装一根回路线。当电桥平衡时,电桥两臂电阻值之比应等于电缆芯线回路组成的两电阻值之比,这是由于导线电阻与它的长度成正比。下面介绍几种测试方法。 展开更多
关键词 电缆故障 电桥平衡 导线电阻 电缆芯线 环路电阻 不平衡电阻 测试方法 故障位置 测试线 电阻温度系
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Temperature coefficient of resistivity of TiAlN films deposited by radio frequency magnetron sputtering 被引量:4
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作者 Min-Ho PARK Sang-Ho KIM 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2013年第2期433-438,共6页
Titanium aluminum nitride (TiAlN) film, as a possible substitute for the conventional tantalum nitride (TAN) or tantalum-aluminum (TaAl) heater resistor in inkjet printheads, was deposited on a Si(100) substra... Titanium aluminum nitride (TiAlN) film, as a possible substitute for the conventional tantalum nitride (TAN) or tantalum-aluminum (TaAl) heater resistor in inkjet printheads, was deposited on a Si(100) substrate at 400 ℃ by radio frequency (RF) magnetron co-sputtering using titanium nitride (TIN) and aluminum nitride (AlN) as ceramic targets. The temperature coefficient of resistivity (TCR) and oxidation resistance, which are the most important properties of a heat resistor, were studied depending on the plasma power density applied during sputtering. With the increasing plasma power density, the crystallinity, grain size and surface roughness of the applied film increased, resulting in less grain boundaries with large grains. The Ti, Al and N binding energies obtained from X-ray photoelectron spectroscopy analysis disclosed the nitrogen deficit in the TiAlN stoichiometry that makes the films more electrically resistive. The highest oxidation resistance and the lowest TCR of-765.43×10^-6 K-l were obtained by applying the highest plasma power density. 展开更多
关键词 inkjet printhead TIALN radio frequency magnetron sputtering temperature coefficient of resistivity
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Study on Low Resistance PTC Ceramic Material
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作者 WANG Feng-he, LEI Wu, XIA Ming-zhu, WANG Feng-yun(Industrial Chemistry Institute, NUST, Nanjing 210094,CHN) 《Semiconductor Photonics and Technology》 CAS 2003年第2期119-122,共4页
The low resistance PTC ceramic thermistor material with excellent eleectricalproperties are successfully fabricated by raw materials at industrial range made in our country onthe study of its composition expression an... The low resistance PTC ceramic thermistor material with excellent eleectricalproperties are successfully fabricated by raw materials at industrial range made in our country onthe study of its composition expression and fabrication process by using the addition of Nb, La, Y,Ta , microstructure regulator BN and ASTL phase . The composition and its fabrication method arestudied. The relation of electrical properties of the PTC ceramic material to its compositionexpression and its related electrical properties are discussed 展开更多
关键词 semiconductor ceramics PTC material DOPING THERMISTOR
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Thin Film Chip Resistors with High Resistance and Low Temperature Coefficient of Resistance 被引量:5
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作者 王秀宇 张之圣 +1 位作者 白天 刘仲娥 《Transactions of Tianjin University》 EI CAS 2010年第5期348-353,共6页
High resistance thin film chip resistors(0603 type) were studied,and the specifications are as follows:1 k? with tolerance about ±0.1% after laser trimming and temperature coefficient of resistance(TCR) less than... High resistance thin film chip resistors(0603 type) were studied,and the specifications are as follows:1 k? with tolerance about ±0.1% after laser trimming and temperature coefficient of resistance(TCR) less than ±15×10-6/℃.Cr-Si-Ta-Al films were prepared with Ar flow rate and sputtering power fixed at 20 standard-state cubic centimeter per minute(sccm) and 100 W,respectively.The experiment shows that the electrical properties of Cr-SiTa-Al deposition films can meet the specification requirements of 0603 ty... 展开更多
关键词 thin film chip resistor high resistance low temperature coefficient of resistance alloy target magnetic sputtering Cr-Si-Ta-Al film
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