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钱江隧道火灾疏散可靠性分析 被引量:4
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作者 徐永 廖少明 李伟平 《公路交通科技》 CAS CSCD 北大核心 2015年第2期108-113,共6页
为评估钱江隧道火灾疏散的可靠性,从而为钱江隧道逃生通道设置方案决策提供参考依据,基于改进的公路隧道需用安全疏散时间RSET计算法,采用Monte Carlo随机数值试验方法,针对钱江隧道的特点,对3种不同的逃生通道方案进行公路隧道火灾人... 为评估钱江隧道火灾疏散的可靠性,从而为钱江隧道逃生通道设置方案决策提供参考依据,基于改进的公路隧道需用安全疏散时间RSET计算法,采用Monte Carlo随机数值试验方法,针对钱江隧道的特点,对3种不同的逃生通道方案进行公路隧道火灾人群疏散随机性仿真模拟,从而可计算不同疏散逃生方案、不同人群疏散荷载下疏散的失效概率。通过对计算结果分析可得:不考虑隧道各项火灾控制与疏散的有利因素,可用安全疏散时间取规范值时,横通道疏散可靠性相对最高,纵横结合逃生方案次之。 展开更多
关键词 隧道工程 疏散可靠性 随机性仿真模拟 钱江隧道
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城市综合交通枢纽的疏散可靠性研究 被引量:1
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作者 林小玉 刘岩 金勇 《山东交通学院学报》 CAS 2019年第4期23-30,共8页
为研究客流疏散问题,以城市综合交通枢纽为研究对象,系统分析交通枢纽的疏散可靠性,以疏散能力为基础建立疏散可靠性模型,运用排队论的相关理论对模型进行求解,并基于某市某枢纽站的客流疏散数据对所建疏散模型进行实例分析。结果表明:... 为研究客流疏散问题,以城市综合交通枢纽为研究对象,系统分析交通枢纽的疏散可靠性,以疏散能力为基础建立疏散可靠性模型,运用排队论的相关理论对模型进行求解,并基于某市某枢纽站的客流疏散数据对所建疏散模型进行实例分析。结果表明:该方法能够定量描述交通枢纽局部以及整体的疏散可靠性,可为枢纽的整体疏散效果评估提供决策依据。 展开更多
关键词 综合交通枢纽 运能 疏散可靠性 排队论
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Effects of Vapor Pressure and Super-Hydrophobic Nanocomposite Coating on Microelectronics Reliability
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作者 Xuejun Fan Liangbiao Chen +2 位作者 C.P.Wong Hsing-Wei Chu G.Q.Zhang 《Engineering》 SCIE EI 2015年第3期384-390,共7页
Modeling vapor pressure is crucial for studying the moisture reliability of microelectronics, as high vapor pressure can cause device failures in environments with high temperature and humidity. To minimize the impact... Modeling vapor pressure is crucial for studying the moisture reliability of microelectronics, as high vapor pressure can cause device failures in environments with high temperature and humidity. To minimize the impact of vapor pressure, a super-hydrophobic(SH) coating can be applied on the exterior surface of devices in order to prevent moisture penetration. The underlying mechanism of SH coating for enhancing device reliability, however, is still not fully understood. In this paper, we present several existing theories for predicting vapor pressure within microelectronic materials. In addition, we discuss the mechanism and effectiveness of SH coating in preventing water vapor from entering a device, based on experimental results. Two theoretical models, a micro-mechanics-based whole-field vapor pressure model and a convection-diffusion model, are described for predicting vapor pressure. Both methods have been successfully used to explain experimental results on uncoated samples. However, when a device was coated with an SH nanocomposite, weight gain was still observed, likely due to vapor penetration through the SH surface. This phenomenon may cast doubt on the effectiveness of SH coatings in microelectronic devices. Based on current theories and the available experimental results, we conclude that it is necessary to develop a new theory to understand how water vapor penetrates through SH coatings and impacts the materials underneath. Such a theory could greatly improve microelectronics reliability. 展开更多
关键词 vapor pressure MOISTURE semiconductor reliability microelectromechanical systems (MEMS) SUPERHYDROPHOBIC nanocomposite coating
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