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用光腔衰荡光谱技术测高反镜的反射率
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作者 吕晓宁 徐勇 《科技与生活》 2012年第8期212-213,共2页
本文根据光腔衰荡光谱技术原理,建立了一套测镜片反射率的装置。选用的镜片是在636 nm的反射率大于99.9%,曲率半径为1 m的平凹镜。通过得到衰荡时间,从而计算出一对相同高反镜的反射率。本实验测得反射率为99.959%,相对偏差在10-5... 本文根据光腔衰荡光谱技术原理,建立了一套测镜片反射率的装置。选用的镜片是在636 nm的反射率大于99.9%,曲率半径为1 m的平凹镜。通过得到衰荡时间,从而计算出一对相同高反镜的反射率。本实验测得反射率为99.959%,相对偏差在10-5。实验表明此方法可以适用于高反镜反射率的精确测量,且重复性良好。 展开更多
关键词 衰荡光谱技术(CRDS) 高反射率 直腔式 测量 脉冲激光
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Generation of Superpositions of Coherent Interaction States Along a Straight Line via Raman Interaction
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作者 YANG Zhen-Biao 《Communications in Theoretical Physics》 SCIE CAS CSCD 2005年第6X期1073-1075,共3页
We present an alternative scheme for preparing the superpositions of coherent states along a straight line of a cavity field using degenerate atom-cavity field Raman interaction. In the scheme, a collection of A-type ... We present an alternative scheme for preparing the superpositions of coherent states along a straight line of a cavity field using degenerate atom-cavity field Raman interaction. In the scheme, a collection of A-type three-level atoms is orderly sent through the cavity to interact with the cavity field adjusted by a microwave source connected to it, followed by state-selective measurements. In this way, we can prepare the superpositions of several coherent states along a straight line with arbitrary weighting factors for the cavity field. In the scheme, the coherence of the atom-cavity system may be maintained and the second microwave field is unnecessary, which is prior to the previous scheme. 展开更多
关键词 coherent states SUPERPOSITIONS straight line Raman interaction
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