The structure,equivalent circuit,noise sources of silicon photodiode are analyzed.In order to improve the measuring linearity,we must choose the silicon photodiode with a large R d,small R s and I 0 and...The structure,equivalent circuit,noise sources of silicon photodiode are analyzed.In order to improve the measuring linearity,we must choose the silicon photodiode with a large R d,small R s and I 0 and under an operation state of output short-circuit.We must let the operation amplifier work in the current-voltage transfer form.Also we analyzed the effects of the input noise voltage,the input noise current,the input offset voltage,the input offset current of the operation amplifier and the noises of the silicon photodiode on the combined circuit of the operation amplifier with the silicon photodiode.Considering these factors,we can design the detective circuit with high response,sensitivity,stability,linearity and SNR .展开更多
The crosstalk caused by oblique incident ray on a PIN detector array is analyzed. An integral expression of crosstalk factor in relation to incident angle and structure parameters is deduced and the correctness of the...The crosstalk caused by oblique incident ray on a PIN detector array is analyzed. An integral expression of crosstalk factor in relation to incident angle and structure parameters is deduced and the correctness of the deduction is tested and verified.展开更多
文摘The structure,equivalent circuit,noise sources of silicon photodiode are analyzed.In order to improve the measuring linearity,we must choose the silicon photodiode with a large R d,small R s and I 0 and under an operation state of output short-circuit.We must let the operation amplifier work in the current-voltage transfer form.Also we analyzed the effects of the input noise voltage,the input noise current,the input offset voltage,the input offset current of the operation amplifier and the noises of the silicon photodiode on the combined circuit of the operation amplifier with the silicon photodiode.Considering these factors,we can design the detective circuit with high response,sensitivity,stability,linearity and SNR .
文摘The crosstalk caused by oblique incident ray on a PIN detector array is analyzed. An integral expression of crosstalk factor in relation to incident angle and structure parameters is deduced and the correctness of the deduction is tested and verified.
