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穿束(Thru—Beam)叉式传感器
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《电子产品世界》 2004年第03B期102-102,共1页
关键词 Balluff公司 叉式传感器 BGL 穿束光
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Fabrication and Characteristics of a Si-Based Single Electron Transistor 被引量:2
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作者 卢刚 陈治明 +1 位作者 王建农 葛惟昆 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第3期246-250,共5页
Si based single electron transistor (SET) is fabricated successfully on p type SIMOX substrate,based on electron beam (EB) lithography,reactive ion etching (RIE) and thermal oxidation.In particular,using thermal oxi... Si based single electron transistor (SET) is fabricated successfully on p type SIMOX substrate,based on electron beam (EB) lithography,reactive ion etching (RIE) and thermal oxidation.In particular,using thermal oxidation and etching off the oxide layer,a one dimensional Si quantum wire can be converted into several quantum dots inside quantum wire in connection with the source and drain regions.The differential conductance (d I ds /d V ds ) oscillations and the Coulomb staircases in the source drain current ( I ds ) are shown clearly dependent on the source drain voltage at 5 3K.The I ds V gs (gate voltage) oscillations are observed from the I ds V gs characteristics as a function of V gs at different temperatures and various values of V ds .For a SET whose total capacitance is about 9 16aF,the I ds V gs oscillations can be observed at 77K. 展开更多
关键词 single electron transistor Coulomb blockade single electron tunneling quantum dot electron beam lithography
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