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Influences of the Exhaust Flow on the Boundary Layer Flow on the Wafer Surface in Spin Coating System
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作者 Seiichi KIMURA Mizue MUNEKATA +2 位作者 Hiroaki KURISHIMA Kazuyoshi MATSUZAKI Hideki OHBA 《Journal of Thermal Science》 SCIE EI CAS CSCD 2005年第2期130-135,共6页
Recently, development of high technology has been required for abe fomaafion of thin uniform film in manufacturing processes of semiconductor as the semiconductor become more sophisticated. Spin coating is usually use... Recently, development of high technology has been required for abe fomaafion of thin uniform film in manufacturing processes of semiconductor as the semiconductor become more sophisticated. Spin coating is usually used for spreading photoresist on a wafer surface. However, since rotating speed of the disk is very high in spin coating, the dropped resist scatters outward and reattaches to the film surface. So, the scattered resist is removed by the exhaust flow generated at the gap between the wafer edge and the catch cup. It is seriously concerned that the stripes called Ekman spiral vortices appears on the disk in the case of high rotating speed and the film thickness increases near the wafer edge in the case of low rotating speed, because it prevent the fomation of uniform film. The purpose of this study is to make clear the generation mechanism of Ekman spiral vortices and the influence of exhaust flow on it. Moreover the influence of the catch cup geometry on the wafer surface boundary layer flow is investigated. 展开更多
关键词 立式圆盘流 自旋电镀 边界层 热-线测量
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