The CaCu3Ti4O12 xerogels, powders and ceramics were prepared through the sol-gel method using two kinds of organic acid (decanoic acid and decanedioic acid). The xerogels, powders and ceramics were characterized by ...The CaCu3Ti4O12 xerogels, powders and ceramics were prepared through the sol-gel method using two kinds of organic acid (decanoic acid and decanedioic acid). The xerogels, powders and ceramics were characterized by the methods of TG-DTG, FT-IR, XRD, SEM and TEM. The dielectric properties of the ceramics were also measured. The results indicated that the powders calcined at 850 ℃ for 2 h are both nanometer scale particles. After sintering, the ceramics mainly consist of the CaCu3Ti4O12 phase. Compared with the powders prepared using monoacid, the particle size of the powders prepared using diacid obviously increases, and the grain size, the relative density and the whole permittivity of the ceramics increase as well. Specially, the ceramic prepared using decanedioic acid has higher relative density (97.3%), dielectric constant (316 808) and lower dielectric loss (0.242 5) at 30 ℃ (10 kIaz)展开更多
基金Projects(CC20120031,CC20110048)supported by Changzhou Science and Technology Innovation Project,China
文摘The CaCu3Ti4O12 xerogels, powders and ceramics were prepared through the sol-gel method using two kinds of organic acid (decanoic acid and decanedioic acid). The xerogels, powders and ceramics were characterized by the methods of TG-DTG, FT-IR, XRD, SEM and TEM. The dielectric properties of the ceramics were also measured. The results indicated that the powders calcined at 850 ℃ for 2 h are both nanometer scale particles. After sintering, the ceramics mainly consist of the CaCu3Ti4O12 phase. Compared with the powders prepared using monoacid, the particle size of the powders prepared using diacid obviously increases, and the grain size, the relative density and the whole permittivity of the ceramics increase as well. Specially, the ceramic prepared using decanedioic acid has higher relative density (97.3%), dielectric constant (316 808) and lower dielectric loss (0.242 5) at 30 ℃ (10 kIaz)