In nanoscale technology, transistor aging is one of the most critical problems that impact on the reliability of circuits. Aging sensor is a good online way to detect the circuit aging, which performs during the opera...In nanoscale technology, transistor aging is one of the most critical problems that impact on the reliability of circuits. Aging sensor is a good online way to detect the circuit aging, which performs during the operating time with no influence of the normal operation of circuits. In this paper, a Dou- ble-edge-triggered Detection Sensor for circuit Aging （DSDA） is proposed, which employs data signal of logic circuits as its clock to control the sampling process. The simulation is done by Hspice using 45 nm technology. The results show that this technique is not case of the detection precision is more than 80% under aging fault effectively with the 8% power cost and 30% sensitive to the process variations. The worst the different process variations. It can detect performance cost.展开更多
The ＂lab-on-fiber＂ concept envisions novel and highly functionalized technological platforms completely integrated in a single optical fiber that would allow the development of advanced devices, components and sub-s...The ＂lab-on-fiber＂ concept envisions novel and highly functionalized technological platforms completely integrated in a single optical fiber that would allow the development of advanced devices, components and sub-systems to be incorporated in modem optical systems for communication and sensing applications. The realization of integrated optical fiber devices requires that several structures and materials at nano- and micro-scale are constructed, embedded and connected all together to provide the necessary physical connections and light-matter interactions. This paper reviews the strategies, the main achievements and related devices in the lab-on-fiber roadmap discussing perspectives and challenges that lie ahead.展开更多
基金Supported by the National Natural Science Foundation of China (No.61274036 and 61106038)Anhui Provincial Natural Science Foundation of China (No.090412034)
文摘In nanoscale technology, transistor aging is one of the most critical problems that impact on the reliability of circuits. Aging sensor is a good online way to detect the circuit aging, which performs during the operating time with no influence of the normal operation of circuits. In this paper, a Dou- ble-edge-triggered Detection Sensor for circuit Aging （DSDA） is proposed, which employs data signal of logic circuits as its clock to control the sampling process. The simulation is done by Hspice using 45 nm technology. The results show that this technique is not case of the detection precision is more than 80% under aging fault effectively with the 8% power cost and 30% sensitive to the process variations. The worst the different process variations. It can detect performance cost.
文摘The ＂lab-on-fiber＂ concept envisions novel and highly functionalized technological platforms completely integrated in a single optical fiber that would allow the development of advanced devices, components and sub-systems to be incorporated in modem optical systems for communication and sensing applications. The realization of integrated optical fiber devices requires that several structures and materials at nano- and micro-scale are constructed, embedded and connected all together to provide the necessary physical connections and light-matter interactions. This paper reviews the strategies, the main achievements and related devices in the lab-on-fiber roadmap discussing perspectives and challenges that lie ahead.
