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A High Breakdown Voltage Thin SOI Device with a Vertically Linearly Graded Concentration Drift Region 被引量:1
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作者 陆生礼 孙智林 +1 位作者 孙伟锋 时龙兴 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2005年第12期2286-2289,共4页
As the thickness of an SOI layer varies,a minimum breakdown voltage is reached when the thickness is about 2μm. The vertical electric field of the SOI LDMOS with a drift region which is vertically linearly graded is ... As the thickness of an SOI layer varies,a minimum breakdown voltage is reached when the thickness is about 2μm. The vertical electric field of the SOI LDMOS with a drift region which is vertically linearly graded is constant. The vertically linearly graded concentration drift can be achieved by impurity implanting followed by thermal diffusion. In this way,the vertical breakdown voltage of SOI LDMOS with 2μm thickness SOI layer can be improved by 43%. The on-state resistance is lowered by 24 % because of the higher impurity concentration of the SOI surface. 展开更多
关键词 SOI vertically linearly graded concentration breakdown voltage LDMOS
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