In this paper we study further on a group testing problem of identifying the defective from a n-coin set containing one defective coin with a balance without weight. The defective coin is not of the same weight as eac...In this paper we study further on a group testing problem of identifying the defective from a n-coin set containing one defective coin with a balance without weight. The defective coin is not of the same weight as each of the normal ones. We derive a new testing algorithm which can tell out the defective from the n-coin set with the worst-case minimum number of tests.展开更多
In this paper we study a group testing model ФX, Y,, XY. In other words, we consider a n-item set containing exactly two defective ones. The purpose of this paper is to find out the two defective items with a worst-c...In this paper we study a group testing model ФX, Y,, XY. In other words, we consider a n-item set containing exactly two defective ones. The purpose of this paper is to find out the two defective items with a worst-case minimum number of tests, each of which will indicates whether the subset being tested contains all good （normal） items or not and in the latter case, it is not sure that the tested subset is of one defective （bad） item or two. Based on the M-sharp algorithm obtained in the previous paper and some combinatorial skills, we derive an almost optimal algorithm for the so called n-problem.展开更多
基金This research is supported partially by Natural Science Foundation of Beijing （1052007,1042007）
文摘In this paper we study further on a group testing problem of identifying the defective from a n-coin set containing one defective coin with a balance without weight. The defective coin is not of the same weight as each of the normal ones. We derive a new testing algorithm which can tell out the defective from the n-coin set with the worst-case minimum number of tests.
基金This research is supported by Natural Science Foundation of Beiing （1052007）.
文摘In this paper we study a group testing model ФX, Y,, XY. In other words, we consider a n-item set containing exactly two defective ones. The purpose of this paper is to find out the two defective items with a worst-case minimum number of tests, each of which will indicates whether the subset being tested contains all good （normal） items or not and in the latter case, it is not sure that the tested subset is of one defective （bad） item or two. Based on the M-sharp algorithm obtained in the previous paper and some combinatorial skills, we derive an almost optimal algorithm for the so called n-problem.
