Pb1-xSrxTiO3 （0≤x≤0.9） thin films on Si （100） substrate were prepared by the sol-gel process and their characteristics were investigated as a function of strontium content（x）. With increasing of the strontium ...Pb1-xSrxTiO3 （0≤x≤0.9） thin films on Si （100） substrate were prepared by the sol-gel process and their characteristics were investigated as a function of strontium content（x）. With increasing of the strontium content, the tetragonality （c/a） was slightly decreased, the splitting peaks become less prominent and the splitting peaks tend to merge into a single peak. Furthermore, the grain size of the films was systematically reduced with the increase in strontium content.展开更多
文摘Pb1-xSrxTiO3 （0≤x≤0.9） thin films on Si （100） substrate were prepared by the sol-gel process and their characteristics were investigated as a function of strontium content（x）. With increasing of the strontium content, the tetragonality （c/a） was slightly decreased, the splitting peaks become less prominent and the splitting peaks tend to merge into a single peak. Furthermore, the grain size of the films was systematically reduced with the increase in strontium content.
