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电动势法测量混合氧离子—电子导电氧化物离子迁移数的理论研究
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作者 黄悦 莫滢钰 +3 位作者 练文超 邱瑞铭 刘建平 雷励斌 《陶瓷学报》 CAS 北大核心 2022年第5期926-933,共8页
混合氧离子-电子导电氧化物材料在固体氧化物燃料电池(SOFCs)/电解池(SOECs)中有广泛应用,准确测量其离子迁移数对其应用和性能优化具有重要意义。电动势(EMF)法是最常用的测量离子迁移数的方法之一,但其测量值仅为材料的表观离子迁移数... 混合氧离子-电子导电氧化物材料在固体氧化物燃料电池(SOFCs)/电解池(SOECs)中有广泛应用,准确测量其离子迁移数对其应用和性能优化具有重要意义。电动势(EMF)法是最常用的测量离子迁移数的方法之一,但其测量值仅为材料的表观离子迁移数t_(i)^(app)。以CeO_(2)基电解质材料为研究对象,通过建立缺陷分布模型研究了CeO_(2)基电解质膜内离子迁移数的分布情况和不同测试条件对EMF方法测得的t_(i)^(app)的影响,依此判断EMF方法的准确性。研究结果表明:离子迁移数在电解质膜内分布不均匀;在电解质膜较薄时,t_(i)^(app)受电解质膜厚度的影响较大;电解质膜两侧存在较大氧化学势梯度时(P_(O_(2))^(high)/p_(O_(2))^(low)>10^(25)),t_(i)^(app)总体上倾向于电解质在高氧分压侧的离子迁移数,并且随温度的升高和材料电子电导率系数的增大而减小;电解质膜两侧均为还原气氛时(Po_(2)>10^(-20)atm),通过EMF方法测出的t_(i)^(app)倾向于电解质在低氧分压侧的离子迁移数;当电解质膜两侧氧分压都较大时(Po_(2)>10^(-15)atm).,t_(i)^(app)主要反映出电解质在高氧分压侧的离子迁移数。 展开更多
关键词 电动势法 固体氧化物燃料电池 缺陷分布模型 混合氧离子—电子导电氧化物 离子迁移数
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Variation of Quantum Efficiency in CZTSSe Solar Cells with Temperature and Bias Dependence by SCAPS Simulation
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作者 Sanghyun Lee Kent J. Price 《Journal of Energy and Power Engineering》 2017年第2期69-77,共9页
The quantum efficiency of CZTSSe (copper zinc tin sulphur selenium) thin film solar cells is numerically simulated at different temperatures and under a set of bias conditions about the efficiency limiting factors. ... The quantum efficiency of CZTSSe (copper zinc tin sulphur selenium) thin film solar cells is numerically simulated at different temperatures and under a set of bias conditions about the efficiency limiting factors. A systematic methodology is developed and integrated into the proposed model to simulate the characteristics in the quantum efficiency. The proposed model is demonstrated with respect to an ideal device model under a set of bias conditions to selectively deactivate performance limiting parameters under light and voltage biased conditions. Under particular wavelength regions and bias conditions, a particular type of defects near the heterojunction interface significantly impact the carrier collection of devices. This deep acceptor type defect distribution is located in the band of +/- 0.3 eV from the midgap. These defect states influence CZTSSe spectral responses of red and IR light wavelength regions in quantum efficiency caused by affected depletion width toward the back contact. Therefore, the quantum efficiency of CZTSSe devices is altered disproportionally at biased conditions. 展开更多
关键词 DEGRADATION thin film solar cells DEFECTS modeling.
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