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模型P缺陷硬币问题的最优方案
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作者 刘文安 丁承杰 《Chinese Quarterly Journal of Mathematics》 CSCD 1994年第1期78-89,共12页
Recently the problem of determining the minimum number of parity tests for finding two defectives remains open.This is a surprisingly difficult combinatorial problem.In this paper,we give three procedurs(H-P-,A-H-Pand... Recently the problem of determining the minimum number of parity tests for finding two defectives remains open.This is a surprisingly difficult combinatorial problem.In this paper,we give three procedurs(H-P-,A-H-Pand U-P) and solve this problem perfectly. 展开更多
关键词 模型P缺陷硬币问题 最优方案
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Researches of DC-Problem Under the Model S in which the Numbers of Defective Coins are not Fixed
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作者 丁承杰 刘文安 《Chinese Quarterly Journal of Mathematics》 CSCD 1992年第4期106-110,共5页
In this paper,we research general Defective Cion Problem under the model S,i.e,the number d of Defective cions is not fixed. For d=O,1,or 2. we get some good results.
关键词 model S test set optimal test scheme
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