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板级SRAM的内建自测试(BIST)设计 被引量:3
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作者 张勇 谈恩民 《桂林电子工业学院学报》 2004年第2期60-63,共4页
板级SRAM的内建自测试的设计,是为了确保板级SRAM的可靠性。考虑到板级SRAM各种故障模型,选择使用MarchC-SOF算法,其对呆滞故障、跳变故障、开路故障、地址译码器故障和字节间组合故障有100%的故障覆盖率,优化面向"字节"的Mar... 板级SRAM的内建自测试的设计,是为了确保板级SRAM的可靠性。考虑到板级SRAM各种故障模型,选择使用MarchC-SOF算法,其对呆滞故障、跳变故障、开路故障、地址译码器故障和字节间组合故障有100%的故障覆盖率,优化面向"字节"的MarchC-SOF算法和扩展延时元素后,算法可对SRAM进行字节内组合故障和数据维持力故障测试。同时在只增加少量成本的情况下,使用FPGA构成存储器的BIST控制器,可以满足SRAM的可测性的要求。 展开更多
关键词 SRAM 自测试设计 MARCH算法 故障模型 BIST 可靠性
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Design of EPS Testing System Based on LabVIEW2012
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作者 LIU Fang-gang LIU Xi 《International English Education Research》 2014年第5期62-64,共3页
The article designed a set of automatic test system of automobiles EPS based on LabVIEW, which can collect current signal and torque signal when emergency braking. It consists of two parts: hardware and software. Har... The article designed a set of automatic test system of automobiles EPS based on LabVIEW, which can collect current signal and torque signal when emergency braking. It consists of two parts: hardware and software. Hardware includes sensors,condition circuits, data acquisition card and your computer. Software-related programs, including an analysis of acquisition signal processing and storage display.The system is stable and reliable by contrast verification. 展开更多
关键词 signal acquisition EPS TEST SYSTEM LABVIEW
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