期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
混合信号边界扫描测试系统的设计与实现
1
作者 李正光 雷加 《电子工业专用设备》 2003年第1期57-61,共5页
分析了混合信号边界扫描测试的工作机制对测试系统的功能需求,实现了符合IEEE1149.4标准的混合信号边界扫描测试系统。仿真和测试实践表明,该测试系统具有对系统级、PCB级和芯片级电路进行简单互连测试、差分测试和参数测试等功能,结构... 分析了混合信号边界扫描测试的工作机制对测试系统的功能需求,实现了符合IEEE1149.4标准的混合信号边界扫描测试系统。仿真和测试实践表明,该测试系统具有对系统级、PCB级和芯片级电路进行简单互连测试、差分测试和参数测试等功能,结构简单、携带方便、工作可靠。 展开更多
关键词 混合信号 边界扫描 测试系统 混合信号 芯片级电路 PCB级
下载PDF
Challenges to Data-Path Physical Design Inside SOC 被引量:2
2
作者 经彤 洪先龙 +5 位作者 蔡懿慈 许静宇 杨长旗 张轶谦 周强 吴为民 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第8期785-793,共9页
Previously,a single data-path stack was adequate for data-path chips,and the complexity and size of the data-path was comparatively small.As current data-path chips,such as system-on-a-chip (SOC),become more complex,m... Previously,a single data-path stack was adequate for data-path chips,and the complexity and size of the data-path was comparatively small.As current data-path chips,such as system-on-a-chip (SOC),become more complex,multiple data-path stacks are required to implement the entire data-path.As more data-path stacks are integrated into SOC,data-path is becoming a critical part of the whole giga-scale integrated circuits (GSI) design.The traditional physical design methodology can not satisfy the data-path performance requirements,because it can not accommodate the data-path bit-sliced structure and the strict performance (such as timing,coupling,and crosstalk) constraints.Challenges in the data-path physical design are addressed.The fundamental problems and key technologies in data-path physical design are analysed.The corresponding researches and solutions in this research field are also discussed. 展开更多
关键词 physical design data-path bit-sliced structure SYSTEM-ON-A-CHIP giga-scale integrated circuits very-deep-submicron
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部