本文介绍一种新型高能量分辨微束 X 荧光分析谱仪,它由导管 X 光透镜和使用位置灵敏正比计数管的波长色散谱仪组成。实验结果表明本谱仪使用的 X 光透镜形成的 X 光微束的最小束径对 Cu Kα线为 50 μm,一次测量同时覆盖的能量范围可达 ...本文介绍一种新型高能量分辨微束 X 荧光分析谱仪,它由导管 X 光透镜和使用位置灵敏正比计数管的波长色散谱仪组成。实验结果表明本谱仪使用的 X 光透镜形成的 X 光微束的最小束径对 Cu Kα线为 50 μm,一次测量同时覆盖的能量范围可达 800 eV 以上,而对 Ti Kα线的能量分辨达到 4.4 eV。展开更多
Determination of chemical elements assay plays an important role in mineral processing operations.This factor is used to control process accuracy,recovery calculation and plant profitability.The new assaying methods i...Determination of chemical elements assay plays an important role in mineral processing operations.This factor is used to control process accuracy,recovery calculation and plant profitability.The new assaying methods including chemical methods,X-ray fluorescence and atomic absorption spectrometry are advanced and accurate.However,in some applications,such as on-line assaying process,high accuracy is required.In this paper,an algorithm based on Kalman Filter is presented to predict on-line XRF errors.This research has been carried out on the basis of based the industrial real data collection for evaluating the performance of the presented algorithm.The measurements and analysis for this study were conducted at the Sarcheshmeh Copper Concentrator Plant located in Iran.The quality of the obtained results was very satisfied;so that the RMS errors of prediction obtained for Cu and Mo grade assaying errors in rougher feed were less than 0.039 and 0.002 and in final flotation concentration less than 0.58 and 0.074,respectively.The results indicate that the mentioned method is quite accurate to reduce the on-line XRF errors measurement.展开更多
A wavelength dispersive X-ray fluorescence （WD-XRF） spectrometry combined with calibration curve method was estab- lished for simultaneously analyzing low-Z elements （C, N, O） and A1, Si, Fe in polyamide. To inves...A wavelength dispersive X-ray fluorescence （WD-XRF） spectrometry combined with calibration curve method was estab- lished for simultaneously analyzing low-Z elements （C, N, O） and A1, Si, Fe in polyamide. To investigate the origin of plastic material causing deposition and blocking in instrument engines and pipelines, polyamide 6 （PA 6, an engineering plastic） was chosen as the study object on account of its common use in industry. The sample preparation with pressed powder disk has been developed for determination of six elements in PA 6. Pure Cu metal was used as the matrix and PA 6 was regarded as standard sample for C, N, O elements. PA 6 particles were firstly smashed to uniform powder in liquid nitrogen, and then mixed with inorganic standard powders （Fe203, A1203, SIO2, and Na2SiO3）. The mixture was ground to obtain homogeneous calibration materials for WD-XRF analysis. The quantitative property of the calibration curve method for each element was re- liable. The limits of detection （S/N≤3） of C, N, O, A1, Si and Fe using WD-XRF were 249, 120, 101, 6.2, 3.3, and 1.8 μg/g, respectively. To confirm the accuracy of the proposed WD-XRF calibration curve method, inductively coupled plasma optical emission spectroscopy （ICP-OES） detection for A1, Si, Fe and elemental analyzer （EA） analysis for C, N, O were utilized. A good correlation of the WD-XRF results with the measurements of ICP-OES and EA was observed.展开更多
文摘本文介绍一种新型高能量分辨微束 X 荧光分析谱仪,它由导管 X 光透镜和使用位置灵敏正比计数管的波长色散谱仪组成。实验结果表明本谱仪使用的 X 光透镜形成的 X 光微束的最小束径对 Cu Kα线为 50 μm,一次测量同时覆盖的能量范围可达 800 eV 以上,而对 Ti Kα线的能量分辨达到 4.4 eV。
基金the support of the Department of Research and Development of Sarcheshmeh Copper Plants for this research
文摘Determination of chemical elements assay plays an important role in mineral processing operations.This factor is used to control process accuracy,recovery calculation and plant profitability.The new assaying methods including chemical methods,X-ray fluorescence and atomic absorption spectrometry are advanced and accurate.However,in some applications,such as on-line assaying process,high accuracy is required.In this paper,an algorithm based on Kalman Filter is presented to predict on-line XRF errors.This research has been carried out on the basis of based the industrial real data collection for evaluating the performance of the presented algorithm.The measurements and analysis for this study were conducted at the Sarcheshmeh Copper Concentrator Plant located in Iran.The quality of the obtained results was very satisfied;so that the RMS errors of prediction obtained for Cu and Mo grade assaying errors in rougher feed were less than 0.039 and 0.002 and in final flotation concentration less than 0.58 and 0.074,respectively.The results indicate that the mentioned method is quite accurate to reduce the on-line XRF errors measurement.
基金supported by the Research Fund for the Doctoral Program of Higher Education (20110002110052)
文摘A wavelength dispersive X-ray fluorescence （WD-XRF） spectrometry combined with calibration curve method was estab- lished for simultaneously analyzing low-Z elements （C, N, O） and A1, Si, Fe in polyamide. To investigate the origin of plastic material causing deposition and blocking in instrument engines and pipelines, polyamide 6 （PA 6, an engineering plastic） was chosen as the study object on account of its common use in industry. The sample preparation with pressed powder disk has been developed for determination of six elements in PA 6. Pure Cu metal was used as the matrix and PA 6 was regarded as standard sample for C, N, O elements. PA 6 particles were firstly smashed to uniform powder in liquid nitrogen, and then mixed with inorganic standard powders （Fe203, A1203, SIO2, and Na2SiO3）. The mixture was ground to obtain homogeneous calibration materials for WD-XRF analysis. The quantitative property of the calibration curve method for each element was re- liable. The limits of detection （S/N≤3） of C, N, O, A1, Si and Fe using WD-XRF were 249, 120, 101, 6.2, 3.3, and 1.8 μg/g, respectively. To confirm the accuracy of the proposed WD-XRF calibration curve method, inductively coupled plasma optical emission spectroscopy （ICP-OES） detection for A1, Si, Fe and elemental analyzer （EA） analysis for C, N, O were utilized. A good correlation of the WD-XRF results with the measurements of ICP-OES and EA was observed.
