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2-(1H-1,2,4-三唑-3-基)吡啶Mn^(Ⅱ)配合物的合成、结构及荧光性质
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作者 谭育慧 刘艺 +2 位作者 陈绍鹏 王长峰 唐云志 《应用化学》 CAS CSCD 北大核心 2018年第10期1249-1255,共7页
采用水热合成法,通过配体[2-(1H-1,2,4-三唑-3-基)吡啶](2-HTP)与MnSO4·H2O中的Mn2+离子组装配位,得到一个结构新颖的配合物[Mn(C7H5N4)·(SO4)·2H2O](1),对其进行元素分析、红外光谱、X射线单晶衍射、固体荧光以及热重... 采用水热合成法,通过配体[2-(1H-1,2,4-三唑-3-基)吡啶](2-HTP)与MnSO4·H2O中的Mn2+离子组装配位,得到一个结构新颖的配合物[Mn(C7H5N4)·(SO4)·2H2O](1),对其进行元素分析、红外光谱、X射线单晶衍射、固体荧光以及热重分析等测试。结构分析表明,配合物1属于单斜晶系P21/n空间群,部分晶胞参数:a=1. 16373(12) nm,b=0. 79324(9) nm,c=1. 40241(15) nm,V=1. 1996(2) nm3,Z=4。在配合物1中,配体2-HTP与Mn2+离子以双齿的方式配位,Mn2+离子还与两个结晶水分子相连并与SO2-4中O原子的桥联作用连接成为一维的链状结构。此外,配体的芳香环之间还存在弱的π-π空间堆积效应,通过对配合物进行固体荧光测试表明其具有良好的蓝光性质,在477 nm处存在较强的荧光发射峰。 展开更多
关键词 [2-(1H-1 2 4-三唑-3-基)吡啶] 一维链状 蓝光性质
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Influence of annealing on the structural,optical and electrical properties of indium oxide films deposited on c-sapphire substrate
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作者 赵鸿铎 弭伟 +1 位作者 张楷亮 赵金石 《Optoelectronics Letters》 EI 2016年第1期39-42,共4页
Indium oxide(In_2O_3) films were prepared on Al_2O_3(0001) substrates at 700 °C by metal-organic chemical vapor deposition(MOCVD).Then the samples were annealed at 800 °C,900 °C and 1 000 °C,respec... Indium oxide(In_2O_3) films were prepared on Al_2O_3(0001) substrates at 700 °C by metal-organic chemical vapor deposition(MOCVD).Then the samples were annealed at 800 °C,900 °C and 1 000 °C,respectively.The X-ray diffraction(XRD) analysis reveals that the samples were polycrystalline films before and after annealing treatment.Triangle or quadrangle grains can be observed,and the corner angle of the grains becomes smooth after annealing.The highest Hall mobility is obtained for the sample annealed at 900 °C with the value about 24.74 cm^2·V^(-1)·s^(-1).The average transmittance for the films in the visible range is over 90%.The optical band gaps of the samples are about 3.73 e V,3.71 e V,3.70 eV and 3.69 eV corresponding to the In_2O_3 films deposited at 700 °C and annealed at 800 °C,900 °C and 1 000 °C,respectively. 展开更多
关键词 ANNEALING Energy gap Hall mobility INDIUM Metallorganic chemical vapor deposition Organic chemicals ORGANOMETALLICS SAPPHIRE SUBSTRATES X ray diffraction analysis
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