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X射线荧光光谱仪及其分析技术的发展 被引量:21
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作者 周国兴 赵恩好 +1 位作者 岳明新 曹丹红 《当代化工》 CAS 2013年第8期1169-1172,共4页
按照获得和分辨特征X射线荧光光谱的方式,X射线荧光光谱仪可以分为波长色散X射线荧光光谱仪(WDXRF)和能量色散X射线荧光光谱仪(EDXRF)两大类。依照这一分类,论述了X射线荧光光谱仪在设备装置和配套方法方面的新状况。X射线荧光光谱仪整... 按照获得和分辨特征X射线荧光光谱的方式,X射线荧光光谱仪可以分为波长色散X射线荧光光谱仪(WDXRF)和能量色散X射线荧光光谱仪(EDXRF)两大类。依照这一分类,论述了X射线荧光光谱仪在设备装置和配套方法方面的新状况。X射线荧光光谱仪整机现在向着小型化、智能化、多功能方面发展,仪器各部件也随着研究的深入而得到了更进一步地改进,在这一基础上,仪器可分析元素的含量范围得到了拓展,方法也得到了丰富。目前,X荧光光谱仪开发了微区面分布的元素成像分析方法、高级次谱线分析方法、薄膜分析方法等新的方法,对这些新方法作以介绍,同时也对基本参数法(FP法)的新近发展作了说明。 展开更多
关键词 波长色散X射线荧光光谱仪 能量色散X射线荧光光谱 微区面分布的元素成像分析 高级次谱线分析方法 薄膜分析方法
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OPTIMUM CUTTING ANALYSIS METHOD OF MEMBRANE STRUCTURE
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作者 邵小方 吴健生 《Transactions of Tianjin University》 EI CAS 1995年第2期189+186-187,189,共4页
By the optimum theory, a new cutting analytical method of the membrane structure is developed. The B-spline curve is applied to make smooth the boundary of the membrane strip. By this method, the cutting accuracy is i... By the optimum theory, a new cutting analytical method of the membrane structure is developed. The B-spline curve is applied to make smooth the boundary of the membrane strip. By this method, the cutting accuracy is improved. Finally, a cutting analysis example of a tension membrane structure is given. 展开更多
关键词 membrane structure cutting analysis optimum theory
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Growth and Chemical Thermodynamics Analysis of SiC Film on Si Substrate by Heating Polystyrene/Silica Bilayer Method
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作者 Yun Li Yu-xia Wang +2 位作者 Zheng Chen Jian-wen Wang You-ming Zou 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 北大核心 2008年第2期151-155,共5页
SiC films were prepared by modified heating polystyrene/silica bilayer method on Si(111) substrate in normal pressure flowing Ar ambient at 1300℃ . The films were investigated by Fourier transform infrared absorpti... SiC films were prepared by modified heating polystyrene/silica bilayer method on Si(111) substrate in normal pressure flowing Ar ambient at 1300℃ . The films were investigated by Fourier transform infrared absorption, X-ray diffraction, and scanning electron microscopy measurements. The chemical thermodynamics process is discussed. The whole reaction can be separated into four steps. The carburizing of SiO is the key step of whole reaction. The main reaction-sequence is figured out based on Gibbs free energy and equilibrium constant. Flowing Ar is necessary to continue the progress of whole reaction by means of carrying out accumulating gaseous resultants. The film is very useful for application in a variety of MOS-based devices for its silica/SiC/Si(111) structure, in which the silica layer can be removed thoroughly by the standard RCA cleaning process. 展开更多
关键词 Thin film Heat treatment Silicon carbide Chemical thermodynamics Silicon monoxide
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