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为塑料容器量身定做的透氧仪问世
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《上海包装》 2005年第4期61-61,共1页
塑料容器成品透氧性能的测试是当前业内的一大难题。现在,济南兰光TOY-C1型容器/薄膜透氧性能测试仪的问世,有效地解决了这一难题。该透氧仪采用电化学原理设计制造,集容器与薄膜透氧性能双重测试功能于一身,既能做薄膜透氧性测试... 塑料容器成品透氧性能的测试是当前业内的一大难题。现在,济南兰光TOY-C1型容器/薄膜透氧性能测试仪的问世,有效地解决了这一难题。该透氧仪采用电化学原理设计制造,集容器与薄膜透氧性能双重测试功能于一身,既能做薄膜透氧性测试,在测试PET瓶等塑料容器的透氧性能方面更表现出方便、快捷、可靠的独特优势。 展开更多
关键词 塑料容器 电化学原理 薄膜透氧性 电脑控制
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Properties of multilayer gallium and aluminum doped ZnO(GZO/AZO) transparent thin films deposited by pulsed laser deposition process 被引量:1
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作者 Jin-Hyun SHIN Dong-Kyun SHIN +1 位作者 Hee-Young LEE Jai-Yeoul LEE 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2011年第A01期96-99,共4页
Multilayer gallium and aluminum doped ZnO (GZO/AZO) films were fabricated by alternative deposition of Ga-doped zinc oxide(GZO) and Al-doped zinc oxide(AZO) thin film by using pulsed laser deposition(PLD) proc... Multilayer gallium and aluminum doped ZnO (GZO/AZO) films were fabricated by alternative deposition of Ga-doped zinc oxide(GZO) and Al-doped zinc oxide(AZO) thin film by using pulsed laser deposition(PLD) process. The electrical and optical properties of these GZO/AZO thin films were investigated and compared with those of GZO and AZO thin films. The GZO/AZO (1:1) thin film deposited at 400 ~C shows the electrical resistivity of 4.18 x 10 4 ~.cm, an electron concentration of 7.5 x 1020/cm3, and carrier mobility of 25.4 cm2/(V.s). The optical transmittances of GZO/AZO thin films are over 85%. The optical band gap energy of GZO/AZO thin films linearly decreases with increasing the AI ratio. 展开更多
关键词 MULTILAYER thin films Ga-doped zinc oxide Al-doped zinc oxide pulsed laser deposition
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Transparent conductive reduced graphene oxide thin films produced by spray coating 被引量:1
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作者 SHI HongFei WANG Can +3 位作者 SUN ZhiPei ZHOU YueLiang JIN KuiJuan YANG GuoZhen 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS CSCD 2015年第1期42-46,共5页
Reduced graphene oxide thin films were fabricated on quartz by spray coating method using a stable dispersion of reduced graphene oxide in N,N-Dimethylformamide.The dispersion was produced by chemical reduction of gra... Reduced graphene oxide thin films were fabricated on quartz by spray coating method using a stable dispersion of reduced graphene oxide in N,N-Dimethylformamide.The dispersion was produced by chemical reduction of graphene oxide,and the film thickness was controlled with the amount of spray volume.AFM measurements revealed that the thin films have near-atomically flat surface.The chemical and structural parameters of the samples were analyzed by Raman and XPS studies.It was found that the thin films show electrical conductivity with good optical transparency in the visible to near infrared region.The sheet resistance of the films can be significantly reduced by annealing in vacuum and reach 58 k?with a light transmittance of 68.69%at 550 nm.The conductive transparent properties of the reduced graphene oxide thin films would be useful to develop flexible electronics. 展开更多
关键词 reduced graphene oxide transparent conductive film spray coating
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Microstructure and optoelectronic properties of galliumtitanium-zinc oxide thin films deposited by magnetron sputtering 被引量:6
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作者 陈首部 陆轴 +3 位作者 钟志有 龙浩 顾锦华 龙路 《Optoelectronics Letters》 EI 2016年第4期280-284,共5页
Gallium-titanium-zinc oxide(GTZO) transparent conducting oxide(TCO) thin films were deposited on glass substrates by radio frequency magnetron sputtering. The dependences of the microstructure and optoelectronic prope... Gallium-titanium-zinc oxide(GTZO) transparent conducting oxide(TCO) thin films were deposited on glass substrates by radio frequency magnetron sputtering. The dependences of the microstructure and optoelectronic properties of GTZO thin films on Ar gas pressure were observed. The X-ray diffraction(XRD) and scanning electron microscopy(SEM) results show that all the deposited films are polycrystalline with a hexagonal structure and have a preferred orientation along the c-axis perpendicular to the substrate. With the increment of Ar gas pressure, the microstructure and optoelectronic properties of GTZO thin films will be changed. When Ar gas pressure is 0.4 Pa, the deposited films possess the best crystal quality and optoelectronic properties. 展开更多
关键词 Conductive films Gallium alloys Magnetron sputtering MICROSTRUCTURE Oxide films Scanning electron microscopy SUBSTRATES Titanium oxides X ray diffraction Zinc Zinc oxide
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