RuO_2包覆的TiO_2纳米复合粒子的表面与界面分析

将溶胶-凝胶法与水热合成技术相结合制备了RuO2包覆量为1.5%的TiO2纳米复合粒子,并采用X射线衍射(XRD)、原子力显微镜(AFM)、傅立叶变换红外光谱(FT-IR)及X射线光电子能谱(XPS)详细研究了纳米复合粒子的表面与界面性质。结果表明,RuO2以非晶态高度分散在TiO2纳米粒子表面形成包覆层,TiO2的晶型为锐钛矿型;纳米复合粒子呈球形,平均粒径约为47.5nm,RuO2包覆层的平均厚度约为0.75nm;RuO2包覆层与核材料TiO2纳米粒子表面存在化学键的作用,这种化学包覆有利于提高纳米复合粒子结构和性能的稳定性。

AFM and XPS Study on the Surface and Interface States of CuPc and SiO_2 Films

A CuPc/SiO2 sample is fabricated. Its morphology is characterized by atomic force microscopy, and the electron states are investigated by X-ray photoelectron spectroscopy. In order to investigate these spectra in detail, all of these spectra are normalized to the height of the most intense peak,and each component is fitted with a single Gaussian function. Analysis shows that the O element has great bearing on the electron states and that SiO2 layers produced by spurting technology are better than those produced by oxidation technology.