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影响Sn电介质绝缘薄膜结构特性的因素
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作者 张玉忠 《真空》 CAS 北大核心 2004年第5期45-48,共4页
用热蒸发法为MOTOROLA中国电子有限公司手持电话外壳表面沉积了具有一定金属光泽的Sn电介质绝缘薄膜,论述了在真空度参数一定时,薄膜沉积时间、蒸发输入电流,以及蒸发源的排列方式诸方面的因素对沉积Sn电介质薄膜绝缘性能结构的影响。... 用热蒸发法为MOTOROLA中国电子有限公司手持电话外壳表面沉积了具有一定金属光泽的Sn电介质绝缘薄膜,论述了在真空度参数一定时,薄膜沉积时间、蒸发输入电流,以及蒸发源的排列方式诸方面的因素对沉积Sn电介质薄膜绝缘性能结构的影响。为此设计了专用环状面源层间互补蒸发电路,用于MOTOROLA中国电子有限公司及其在中国以外的公司生产手持电话外壳表面沉积Sn电介质绝缘薄膜。在生产实际过程中,有针对性地研究了影响沉积Sn电介质绝缘薄膜的各种因素,有效的控制了沉积Sn电介质绝缘薄膜的工艺参数。对指导大规模生产有较高参考价值。 展开更多
关键词 真空度 Sn材料 衬底排列 蒸发源
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Fabrication and properties of well-ordered arrays of single-crystalline NiSi2 nanowires and epitaxial NiSi2/Si heterostructures
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作者 Chenfu Chuang Shaoliang Cheng 《Nano Research》 SCIE EI CAS CSCD 2014年第11期1592-1603,共12页
In this study, we reported the design, fabrication, and characterization of well- ordered arrays of vertically-aligned, epitaxial NiSi2/Si heterostructures and single- crystalline NiSi2 nanowires on (001)Si substrat... In this study, we reported the design, fabrication, and characterization of well- ordered arrays of vertically-aligned, epitaxial NiSi2/Si heterostructures and single- crystalline NiSi2 nanowires on (001)Si substrates. The epitaxial NiSi2 with {111} facets was found to be the first and the only silicide phase formed inside the Si nanowires after annealing at a temperature as low as 300℃. Upon annealing at 500 ℃ for 4 h, the residual parts of Si nanowires were completely consumed and the NiSi2/Si heterostructured nanowires were transformed to fully silicided NiSi2 nanowires. XRD, TEM and SAED analyses indicated that all the NiSi2 nanowires were single crystalline and their axial orientations were parallel to the [001] direction. The obtained vertically-aligned NiSi2 nanowires, owing to their well-ordered arrangement, single-crystalline structure, and low effective work function, exhibit excellent field-emission properties with a very low turn-on field of 1.1 V/m. The surface wettability of the nanowires was found to switch from hydrophobic to hydrophilic after the formation of NiSi2 phase and the measured water contact angle decreased with increasing extent of Ni silicidation. The increased hydrophilicity can be explained by the Wenzel model. The obtained results present the exciting prospect that the new approach proposed here will provide the capability to fabricate other highly-ordered, vertically-aligned fully silicided nanowire arrays and may offer potential applications in constructing vertical silicide-based nanodevices. 展开更多
关键词 nanosphere lithography Si nanowire NiSi2 nanowire field emission WETTABILITY
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